Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Funaki, T.
Kashyap, A. S.
Mantooth, H. A.
Balda, J. C.
Barlow, F. D.
Kimoto, T.
and
Hikihara, T.
2006.
Characterization of SiC JFET for temperature dependent device modeling.
p.
1.
Ku, Kap Ryeol
Kim, Jung Kyu
Seo, Jung Doo
Lee, Ju Young
Kyun, Myung Ok
Lee, Won Jae
Lee, Geun Hyoung
Kim, Il Soo
and
Shin, Byoung Chul
2006.
High Quality SiC Crystals Grown by the Physical Vapor Transport Method with a New Crucible Design.
Materials Science Forum,
Vol. 527-529,
Issue. ,
p.
83.
Dautrich, Morgen S.
Lenahan, Patrick M.
and
Lelis, Aivars J.
2006.
Identification of trapping defects in 4H-silicon carbide metal-insulator-semiconductor field-effect transistors by electrically detected magnetic resonance.
Applied Physics Letters,
Vol. 89,
Issue. 22,
Henkel, Karsten
Torche, Mohamed
Sohal, Rakesh
Schwiertz, Carola
Hoffmann, Patrick
and
Schmeißer, Dieter
2006.
Pr-O-N Dielectrics for MIS Stacks on Silicon and Silicon Carbide Surfaces.
MRS Proceedings,
Vol. 911,
Issue. ,
Wang, S.H.
Arnold, Owen
Eichfeld, C.M.
Mohney, S.E.
Adedeji, A.V.
and
Williams, John R.
2006.
Tantalum-Ruthenium Diffusion Barriers for Contacts to SiC.
Materials Science Forum,
Vol. 527-529,
Issue. ,
p.
883.
Deng, Yanqing
Wang, Wei
Fang, Qizhi
Koushik, Mahalingam B.
and
Chow, T. Paul
2006.
Extraction of SiO2/SiC interface trap profile in 4H- and 6H-SiC metal-oxide semiconductor field-effect transistors from subthreshold characteristics at 25°C and 150°C.
Journal of Electronic Materials,
Vol. 35,
Issue. 4,
p.
618.
Pokropivnyi, V. V.
and
Silenko, P. M.
2006.
Silicon carbide nanotubes and nanotubular fibers: Synthesis, stability, structure, and classification.
Theoretical and Experimental Chemistry,
Vol. 42,
Issue. 1,
p.
3.
RAMIREZ, Isaías Juárez
MATSUMARU, Koji
and
ISHIZAKI, Kozo
2006.
Development of a Near Zero Thermal Expansion Porous Material.
Journal of the Ceramic Society of Japan,
Vol. 114,
Issue. 1336,
p.
1111.
Suchodolskis, A.
Hallén, A.
Linnarsson, M.K.
Österman, J.
and
Karlsson, U.O.
2006.
Ion implantation damage annealing in 4H-SiC monitored by scanning spreading resistance microscopy.
Thin Solid Films,
Vol. 515,
Issue. 2,
p.
611.
Yoo, D.
Limb, J.
Ryou, J.-H.
Lee, W.
and
Dupuis, R. D.
2006.
GaN full-vertical p-i-n rectifiers employing AlGaN:Si conducting buffer layers on n-SiC substrates.
Applied Physics Letters,
Vol. 88,
Issue. 19,
Cheong, Kuan Yew
Bahng, Wook
and
Kim, Nam-Kyun
2007.
Effects of thermal nitrided gate-oxide thickness on 4H silicon-carbide-based metal-oxide-semiconductor characteristics.
Applied Physics Letters,
Vol. 90,
Issue. 1,
Kim, Jung Gon
An, Joon Ho
Seo, Jung Doo
Kim, Jung Kyu
Kyun, Myung Ok
Lee, Won Jae
Kim, Il Soo
Shin, Byoung Chul
and
Ku, Kap Ryeol
2007.
Hydrogen Effect on SiC Single Crystal Prepared by the Physical Vapor Transport Method.
Materials Science Forum,
Vol. 556-557,
Issue. ,
p.
25.
Henkel, Karsten
Sohal, Rakesh
Schwiertz, Carola
Burkov, Yevgen
Torche, Mohamed
and
Schmeißer, Dieter
2007.
Al-Oxynitride Buffer Layer Facilities for PrOX/SiC Interfaces.
MRS Proceedings,
Vol. 996,
Issue. ,
Kim, Weon-Ju
Kang, Seok Min
Jung, Choong Hwan
Park, Ji Yeon
and
Ryu, Woo-Seog
2007.
Growth of SiC nanowires within stacked SiC fiber fabrics by a noncatalytic chemical vapor infiltration technique.
Journal of Crystal Growth,
Vol. 300,
Issue. 2,
p.
503.
Katharria, Y.S.
Kumar, Sandeep
Prakash, Ram
Choudhary, R.J.
Singh, F.
Phase, D.M.
and
Kanjilal, D.
2007.
Characterizations of pulsed laser deposited SiC thin films.
Journal of Non-Crystalline Solids,
Vol. 353,
Issue. 52-54,
p.
4660.
Hullavarad, S. S.
Pugel, D. E.
Jones, E. B.
Vispute, R. D.
and
Venkatesan, T.
2007.
Low Leakage Current Transport and High Breakdown Strength of Pulsed Laser Deposited HfO2/SiC Metal-Insulator-Semiconductor Device Structures.
Journal of Electronic Materials,
Vol. 36,
Issue. 6,
p.
648.
Katharria, Y.S.
Kumar, Sandeep
and
Kanjilal, D.
2007.
Influence of SHI irradiation on the formation of buried SiC.
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms,
Vol. 260,
Issue. 2,
p.
563.
Seo, Jung Doo
An, Joon Ho
Kim, Jung Gon
Kim, Jung Kyu
Kyun, Myung Ok
Lee, Won Jae
Kim, Il Soo
Shin, Byoung Chul
and
Ku, Kap Ryeol
2007.
An Inserted Epitaxial Layer for SiC Single Crystal Growth by the Physical Vapor Transport Method.
Materials Science Forum,
Vol. 556-557,
Issue. ,
p.
9.
Katharria, Y.S.
Kumar, Sandeep
Choudhary, R.J.
Prakash, Ram
Singh, F.
Lalla, N.P.
Phase, D.M.
and
Kanjilal, D.
2008.
Pulsed laser deposition of SiC thin films at medium substrate temperatures.
Thin Solid Films,
Vol. 516,
Issue. 18,
p.
6083.
Diaz Cano, A.I.
Torchynska, T.V.
Urbina-Alvarez, J.E.
Paredes Rubio, G.R.
Jiménez Sandoval, S.
and
Vorobiev, Y.V.
2008.
Porous SiC layers on Si nanowire surface.
Microelectronics Journal,
Vol. 39,
Issue. 3-4,
p.
507.