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Ultrafast switching in an atomic wire system at surfaces

Published online by Cambridge University Press:  10 July 2018

Michael Horn-von Hoegen
Michael Horn-von Hoegen*
Affiliation:
Department of Physics, Duisburg-Essen University, Germany; [email protected]
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Abstract

Ultrafast electron diffraction has been employed for the study of structural dynamics at surfaces in the time domain. Experiments were performed in a pump-probe setup with femtosecond-laser excitation and subsequent probing through diffraction of a femtosecond electron pulse at a temporal resolution of 350 fs. The system of interest is one atomic layer of indium atoms on a Si(111) surface. Through self-assembly, indium atomic wires form and exhibit a Peierls-like, insulator-to-metal phase transition that can be driven nonthermally through a femtosecond laser pulse. The transient intensity of the diffraction spots indicates the lifting of the Peierls transition and melting of a charge-density wave in only 700 fs, heating of the surface in 6 ps, and formation of a metastable and supercooled phase, which exists for nanoseconds.

Keywords

phase transformationreflection high-energy electron diffractionmetal-insulator transitionlaser-induced reaction
Type
Ultrafast Imaging of Materials Dynamics
Information
MRS Bulletin , Volume 43 , Issue 7: Ultrafast Imaging of Materials Dynamics , July 2018 , pp. 512 - 519
Copyright
Copyright © Materials Research Society 2018 

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References

Peierls, R., More Surprises in Theoretical Physics, Princeton Series in Physics (Princeton University Press, Princeton, NJ, 1991).Google Scholar
Jahn, H.A., Teller, E., Proc. R. Soc. Lond. A 161, 220 (1937).CrossRefGoogle Scholar
Siders, C.W., Cavalleri, A., Sokolowski-Tinten, K., Tóth, Cs., Guo, T., Kammler, M., Horn-von Hoegen, M., Wilson, K.R., von der Linde, D., Barty, C.P.J., Science 286, 1340 (1999).Google Scholar
Cavalleri, A., Siders, C.W., Brown, F.L.H., Leitner, D.M., Tóth, C., Squier, J.A., Barty, C.P.J., Wilson, K.R., Sokolowski-Tinten, K., Horn-von Hoegen, M., von der Linde, D., Kammler, M., Phys. Rev. Lett. 85, 586 (2000).CrossRefGoogle Scholar
Sokolowski-Tinten, K., Blome, C., Blums, J., Cavalleri, A., Dietrich, C., Tarasevitch, A., Uschmann, I., Förster, E., Kammler, M., Horn-von Hoegen, M., von der Linde, D., Nature 422, 287 (2003).CrossRefGoogle Scholar
Fritz, D.M., Reis, D.A., Adams, B., Akre, R.A., Arthur, J., Blome, C., Bucksbaum, P.H., Cavalieri, A.L., Engemann, S., Fahy, S., Falcone, R.W., Fuoss, P.H., Gaffney, K.J., George, M.J., Hajdu, J., Hertlein, M.P., Hillyard, P.B., Horn-von Hoegen, M., Kammler, M., Kaspar, J., Kienberger, R., Krejcik, P., Lee, S.H., Lindenberg, A.M., McFarland, B., Meyer, D., Montagne, T., Murray, É.D., Nelson, A.J., Nicoul, M., Pahl, R., Rudati, J., Schlarb, H., Siddons, D.P., Sokolowski-Tinten, K., Tschentscher, Th., von der Linde, D., Hastings, J.B., Science 315, 633 (2007).Google Scholar
Weisshaupt, J., Juvé, V., Holtz, M., Ku, S.A., Woerner, M., Elsaesser, T., Ališauskas, S., Pugžlys, A., Baltuška, A., Nat. Photonics 8, 927 (2014).CrossRefGoogle Scholar
Bargheer, M., Zhavoronkov, N., Woerner, M., Elsaesser, T., Chem. Phys. Chem. 7, 783 (2006).CrossRefGoogle Scholar
Bargheer, M., Woo, J.C., Zhavoronkov, N., Kim, D.S., Woerner, M., Elsaesser, T., Phys. Status Solidi B 243, 2389 (2006).CrossRefGoogle Scholar
Baltuska, A., Cerullo, G., Tabletop Intense Femtosecond Pulse Sources and Their Applications (Springer, Berlin, 2018).Google Scholar
Lindenberg, A.M., Johnson, S.L., Reis, D.A., Annu. Rev. Mater. Res. 47, 15 (2017).CrossRefGoogle Scholar
Siwick, B.J., Dwyer, J.R., Jordan, R.E., Miller, R.J.D., Science 302, 1382 (2003).CrossRefGoogle Scholar
Baum, P., Yang, D.-S., Zewail, A.H., Science 318, 788 (2007).CrossRefGoogle Scholar
Sciaini, G., Harb, M., Kruglik, S.G., Payer, T., Hebeisen, C.T., Meyer zu Heringdorf, F.-J., Yamaguchi, M., Horn-von Hoegen, M., Ernstorfer, R., Miller, R.J.D., Nature 458, 56 (2009).CrossRefGoogle Scholar
Eichberger, M., Schäfer, H., Krumova, M., Beyer, M., Demsar, J., Berger, H., Moriena, G., Sciaini, G., Miller, R.J.D., Nature 468, 799 (2010).CrossRefGoogle Scholar
Gao, M., Lu, C., Jean-Ruel, H., Liu, L.C., Marx, A., Onda, K., Koshihara, S., Nakano, Y., Shao, X., Hiramatsu, T., Saito, G., Yamochi, H., Cooney, R.R., Moriena, G., Sciaini, G., Miller, R.J.D., Nature 496, 343 (2013).CrossRefGoogle Scholar
Morrison, V., Chatelain, R.P., Tiwari, K., Hendaoui, A., Chaker, M., Siwick, B.J., Science 346, 445 (2014).CrossRefGoogle Scholar
Chatelain, R.P., Morrison, V.R., Klarenaar, B.L.M., Siwick, B.J., Phys. Rev. Lett. 113, 235502 (2014).CrossRefGoogle Scholar
Morimoto, Y., Baum, P., Nat. Phys 14, 252 (2018).CrossRefGoogle Scholar
Weathersby, S.P., Brown, G., Centurion, M., Chase, T.F., Coffee, R., Corbett, J., Eichner, J.P., Frisch, J.C., Fry, A.R., Gühr, M., Hartmann, N., Hast, C., Hettel, R., Jobe, R.K., Jongewaard, E.N., Lewandowski, J.R., Li, R.K., Lindenberg, A.M., Makasyuk, I., May, J.E., McCormick, D., Nguyen, M.N., Reid, A.H., Shen, X., Sokolowski-Tinten, K., Vecchione, T., Vetter, S.L., Wu, J., Yang, J., Dürr, H.A., Wang, X.J., Rev. Sci. Instrum. 86, 073702 (2015).CrossRefGoogle Scholar
Sokolowski-Tinten, K., Li, R., Reid, A., Weathersby, S., Quirin, F., Chase, T., Coffee, R., Corbett, J., Fry, A., Hartmann, N., Hast, C., Hettel, R., Horn-von Hoegen, M., Janoschka, D., Lewandowski, J., Ligges, M., Meyer zu Heringdorf, F., Shen, X., Vecchione, T., Witt, C., Wu, J., Dürr, H., Wang, X., New J. Phys. 17, 113047 (2015).CrossRefGoogle Scholar
Mourou, G., Williamson, S., Appl. Phys. Lett. 41, 44 (1982).CrossRefGoogle Scholar
Elsayed-Ali, H.E., Mourou, G.A., Appl. Phys. Lett. 52, 103 (1988).CrossRefGoogle Scholar
Elsayed-Ali, H.E., Herman, J.W., Rev. Sci. Instrum. 61, 1636 (1990).CrossRefGoogle Scholar
Aeschlimann, M., Hull, E., Cao, J., Schmuttenmaer, C.A., Jahn, L.G., Gao, Y., Elsayed-Ali, H.E., Mantell, D.A., Scheinfein, M.R., Rev. Sci. Instrum. 66, 1000 (1995).CrossRefGoogle Scholar
Ruan, C.-Y., Vigliotti, F., Lobastov, V.A., Chen, S., Zewail, A.H., Proc. Natl. Acad. Sci. U.S.A. 101, 1123 (2004).CrossRefGoogle Scholar
Vigliotti, F., Chen, S., Ruan, C.-Y., Lobastov, V.A., Zewail, A.H., Angew. Chem. Int. Ed. Engl. 43, 2705 (2004).CrossRefGoogle Scholar
Ruan, C.-Y., Lobastov, V.A., Vigliotti, F., Chen, S., Zewail, A.H., Science 304, 80 (2004).CrossRefGoogle Scholar
Cavalleri, A., Science 318, 755 (2007).CrossRefGoogle Scholar
Hanisch-Blicharski, A., Janzen, A., Krenzer, B., Wall, S., Klasing, F., Kalus, A., Frigge, T., Kammler, M., Horn-von Hoegen, M., Ultramicroscopy 127, 2 (2013).CrossRefGoogle Scholar
Janzen, A., Krenzer, B., Zhou, P., von der Linde, D., Horn-von Hoegen, M., Surf. Sci. 600, 4094 (2006).CrossRefGoogle Scholar
Janzen, A., Krenzer, B., Heinz, O., Zhou, P., Thien, D., Hanisch, A., Meyer zu Heringdorf, F.-J., von der Linde, D., Horn-von Hoegen, M., Rev. Sci. Instrum. 78, 013906 (2007).CrossRefGoogle Scholar
Siwick, B.J., Dwyer, J.R., Jordan, R.E., Miller, R.J.D., J. Appl. Phys. 92, 1643 (2002).CrossRefGoogle Scholar
Ichimiya, A., Cohen, P.I.,Reflection High Energy Electron Diffraction (Cambridge University Press, Cambridge, UK, 2004).CrossRefGoogle Scholar
Braun, W., Applied RHEED: Reflection High-Energy Electron Diffraction during Crystal Growth (Springer, Berlin, 2013).Google Scholar
Vogelgesang, S., Storeck, G., Horstmann, J.G., Diekmann, T., Sivis, M., Schramm, S., Rossnagel, K., Schäfer, S., Ropers, C., Nat. Phys. 14, 184 (2018).CrossRefGoogle Scholar
Baum, P., Zewail, A.H., Proc. Natl. Acad. Sci. U.S.A. 103, 16105 (2006).CrossRefGoogle Scholar
Zhou, P., Streubühr, C., Kalus, A., Frigge, T., Wall, S., Hanisch-Blicharski, A., Kammler, M., Ligges, M., Bovensiepen, U., von der Linde, D., Horn-von Hoegen, M., EPJ Web Conf. 41, 10016 (2013).CrossRefGoogle Scholar
Frigge, T., Hafke, B., Witte, T., Krenzer, B., Streubühr, C., Samad Syed, A., Mikšić Trontl, V., Avigo, I., Zhou, P., Ligges, M., von der Linde, D., Bovensiepen, U., Horn-von Hoegen, M., Wippermann, S., Lücke, A., Sanna, S., Gerstmann, U., Schmidt, W.G., Nature 544, 207 (2017).CrossRefGoogle Scholar
Kury, P., Hild, R., Thien, D., Günter, H.-L., Meyer zu Heringdorf, F.-J., Horn-von Hoegen, M., Rev. Sci. Instrum. 76, 083906 (2005).CrossRefGoogle Scholar
Yeom, H.W., Takeda, S., Rotenberg, E., Matsuda, I., Horikoshi, K., Schaefer, J., Lee, C.M., Kevan, S.D., Ohta, T., Nagao, T., Hasegawa, S., Phys. Rev. Lett. 82, 4898 (1999).CrossRefGoogle Scholar
Ryjkov, S.V., Nagao, T., Lifshits, V.G., Hasegawa, S., Surf. Sci. 488, 15 (2001).CrossRefGoogle Scholar
Bunk, O., Falkenberg, G., Zeysing, J.H., Lottermoser, L., Johnson, R.L., Nielsen, M., Berg-Rasmussen, F., Baker, J., Feidenhans’l, R., Phys. Rev. B Condens. Matter 59, 12228 (1999).CrossRefGoogle Scholar
Kumpf, C., Bunk, O., Zeysing, J.H., Su, Y., Nielsen, M., Johnson, R.L., Feidenhans’l, R., Bechgaard, K., Phys. Rev. Lett. 85, 4916 (2000).CrossRefGoogle Scholar
Wippermann, S., Schmidt, W.G., Phys. Rev. Lett. 105, 126102 (2010).CrossRefGoogle Scholar
Schmidt, W.G., Wippermann, S., Sanna, S., Babilon, M., Vollmers, N.J., Gerstmann, U., Phys. Status Solidi B 249, 343 (2012).CrossRefGoogle Scholar
Wall, S., Krenzer, B., Wippermann, S., Sanna, S., Klasing, F., Hanisch-Blicharski, A., Kammler, M., Schmidt, W.G., Horn-von Hoegen, M., Phys. Rev. Lett. 109, 186101 (2012).CrossRefGoogle Scholar
Park, S.J., Yeom, H.W., Min, S.H., Park, D.H., Lyo, I.-W., Phys. Rev. Lett. 93, 106402 (2004).CrossRefGoogle Scholar
Kim, H.-J., Cho, J.-H., Phys. Rev. Lett. 110, 116801 (2013).CrossRefGoogle Scholar
Klasing, F., Frigge, T., Hafke, B., Wall, S., Krenzer, B., Hanisch-Blicharski, A., Horn-von Hoegen, M., Phys. Rev. B Condens. Matter 89, 121107(R) (2014).CrossRefGoogle Scholar
Perfetti, L., Loukakos, P.A., Lisowski, M., Bovensiepen, U., Berger, H., Biermann, S., Cornaglia, P.S., Georges, A., Wolf, M., Phys. Rev. Lett. 97, 067402 (2006).CrossRefGoogle Scholar
Schäfer, H., Kabanov, V.V., Beyer, M., Biljakovic, K., Demsar, J., Phys. Rev. Lett. 105, 066402 (2010).CrossRefGoogle Scholar
Rettig, L., Cortés, R., Chu, J.-H., Fisher, I.R., Schmitt, F., Moore, R.G., Shen, Z.-X., Kirchmann, P.S., Wolf, M., Bovensiepen, U., Nat. Commun. 7, 10459 (2016).CrossRefGoogle Scholar
Hellmann, S., Rohwer, T., Kalläne, M., Hanff, K., Sohrt, C., Stange, A., Carr, A., Murnane, M.M., Kapteyn, H.C., Kipp, L., Bauer, M., Rossnagel, K., Nat. Commun. 3, 1069 (2012).CrossRefGoogle Scholar
Debye, P., Ann. Phys. 348, 49 (1913).CrossRefGoogle Scholar
Waller, I., Z. Phys. A 17, 398 (1923).CrossRefGoogle Scholar
Frigge, T., Hafke, B., Witte, T., Krenzer, B., Horn-von Hoegen, M., Struct. Dyn. 5, 025101 (2018).CrossRefGoogle Scholar