Hostname: page-component-7b9c58cd5d-f9bf7 Total loading time: 0 Render date: 2025-03-13T13:32:06.426Z Has data issue: false hasContentIssue false
  • English
  • Français

Quantitative In Situ Mechanical Testing in Electron Microscopes

Published online by Cambridge University Press:  31 January 2011

M. Legros ,
D.S. Gianola  and
C. Motz
Get access

Abstract

This article is devoted to recent progress in the area of in situ electron microscopy (scanning and transmission) and will focus on quantitative aspects of these techniques as applied to the deformation of materials. Selected recent experiments are chosen to illustrate how these techniques have benefited from improvements ranging from sample preparation to digital image acquisition. Known for its ability to capture the underlying phenomena of plastic deformation as they occur, in situ electron microscopy has evolved to a level where fully instrumented micro- and nanomechanical tests can be performed simultaneously.

Type
Research Article
Information
MRS Bulletin , Volume 35 , Issue 5: In Situ Mechanical Testing of Biological and Inorganic Materials at the Micro- and Nanoscales , May 2010 , pp. 354 - 360
Copyright
Copyright © Materials Research Society 2010

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Budrovic, Z., Van Swygenhoven, H., Derlet, P.M., Van Petegem, S., Schmitt, B., Science 304 (5668), 273 (2004).CrossRefGoogle Scholar
2.Maass, R., Van Petegem, S., Grolimund, D., Van Swygenhoven, H., Kiener, D., Dehm, G., Appl. Phys. Lett. 92 (7), 071905 (2008).CrossRefGoogle Scholar
3.Kim, J.S., LaGrange, T., Reed, B.W., Taheri, M.L., Armstrong, M.R., King, W.E., Browning, N.D., Campbell, G.H., Science 321 (5895), 1472 (2008).CrossRefGoogle Scholar
4.Shorokhov, D., Zewail, A.H., Phys. Chem. Chem. Phys. 10 (20), 2879 (2008).CrossRefGoogle Scholar
5.Deuschle, J.K., Buerki, G., Deuschle, H.M., Enders, S., Michler, J., Arzt, E., Acta Mater. 56 (16), 4390 (2008).CrossRefGoogle Scholar
6.Rzepiejewska-Malyska, K.A., Buerki, G., Michler, J., Major, R.C., Cyrankowski, E., Asif, S.A.S., Warren, O.L., J. Mater. Res. 23 (7), 1973 (2008).CrossRefGoogle Scholar
7.Gane, N., Bowden, F.P., J. Appl. Phys. 39 (3), 1432 (1968).CrossRefGoogle Scholar
8.Gane, N., Proc. R. Soc. London, Ser. A 317 (1530), 367 (1970).Google Scholar
9.Dingley, D.J., in Proc. 3rd Annual SEM Symposium IIT, Res. Inst., Chicago, IL (1970).Google Scholar
10.Fleck, N.A., Muller, G.M., Ashby, M.F., Hutchinson, J.W., Acta Mater. 42, 475 (1994).CrossRefGoogle Scholar
11.Stolken, J.S., Evans, A.G., Acta Mater. 46, 5109 (1998).CrossRefGoogle Scholar
12.Haque, M.A., Saif, M.T.A., Acta Mater. 51, 3053 (2003).CrossRefGoogle Scholar
13.Motz, C., Schöberl, T., Pippan, R., Acta Mater. 53 (15), 4269 (2005).CrossRefGoogle Scholar
14.Wurster, S., Motz, C., Jenko, M., Pippan, R., Adv. Eng. Mater. 12, 61 (2009).CrossRefGoogle Scholar
15.Silcox, J., Whelan, M.J., Philos. Mag. 5, 1 (1960).CrossRefGoogle Scholar
16.Louchet, F., Kubin, L.P., Vesely, D., Philos. Mag. A. 39 (4), 433 (1979).CrossRefGoogle Scholar
17.Couret, A., Crestou, J., Farenc, S., Molenat, G., Clément, N., Coujou, A., Caillard, D., Microsc. Microanal. Microstruct. 4, 153 (1993).CrossRefGoogle Scholar
18.Jacques, A., George, A., Polcarova, M., Bradler, J., Nucl. Instrum. Methods Phys. Res., Sect. B 200, 261 (2003).CrossRefGoogle Scholar
19.Vanderschaeve, G., Caillard, D., Mater. Sci. Eng., A 462 (1–2), 418 (2007).CrossRefGoogle Scholar
20.Mompiou, F., Caillard, D., Feuerbacher, M., Philos. Mag. A. 84 (25–26), 2777 (2004).CrossRefGoogle Scholar
21.Legros, M., Couret, A., Caillard, D., Philos. Mag. A 73 (1), 81 (1996).CrossRefGoogle Scholar
22.Legros, M., Minonishi, Y., Caillard, D., Philos. Mag. A 76 (5), 1013 (1997).CrossRefGoogle Scholar
23.Legros, M., Clement, N., Caron, P., Coujou, A., Mater. Sci. Eng., A 337 (1–2), 160 (2002).CrossRefGoogle Scholar
24.Farenc, S., Coujou, A., Couret, A., Philos. Mag. 67 (11), 127 (1993).CrossRefGoogle Scholar
25.Oh, S.H., Legros, M., Kiener, D., Gruber, P., Dehm, G., Acta Mater. 55 (16), 5558 (2007).CrossRefGoogle Scholar
26.Legros, M., Gianola, D.S., Hemker, K.J., Acta Mater. 56, 3380 (2008).CrossRefGoogle Scholar
27.Caillard, D., Philos. Mag. Lett. 89 (8), 517 (2009).CrossRefGoogle Scholar
28.Uchic, M.D., Dimiduk, D.M., Mater. Sci. Eng., A 400–401 (1–2 Suppl.), 268 (2005).CrossRefGoogle Scholar
29.Uchic, M.D., Dimiduk, D.M., Florando, J.N., Nix, W.D., Science 305 (5686), 986 (2004).CrossRefGoogle Scholar
30.Greer, J.R., Weinberger, C.R., Cai, W., Mater. Sci. Eng., A 493 (1–2), 21 (2008).CrossRefGoogle Scholar
31.Greer, J., Kim, J.-Y., Burek, M., JOM 61 (12), 19 (2009).CrossRefGoogle Scholar
32.Kiener, D., Grosinger, W., Dehm, G., Pippan, R., Acta Mater. 56 (3), 580 (2008).CrossRefGoogle Scholar
33.Shan, Z.W., Mishra, R.K., Asif, S.A.S., Warren, O.L., Minor, A.M., Nat. Mater. 7 (2), 115 (2008).CrossRefGoogle Scholar
34.Bei, H., Shim, S., Miller, M.K., Pharr, G.M., George, E.P., Appl. Phys. Lett. 91 (11), 111915 (2007).CrossRefGoogle Scholar
35.Shim, S., Bei, H., Miller, M.K., Pharr, G.M., George, E.P., Acta Mater. 57 (2), 503 (2009).CrossRefGoogle Scholar
36.Bei, H., Shim, S., George, E.P., Miller, M.K., Herbert, E.G., Pharr, G.M., Scr. Mater. 57 (5), 397 (2007).CrossRefGoogle Scholar
37.Zhang, D., Breguet, J.-M., Clavel, R., Phillippe, L., Utke, I., Michler, J., Nanotechnology 20, 36 (2009).Google Scholar
38.Östlund, F., Rzepiejewska-Malyska, K., Leifer, K., Hale, L.M., Tang, Y., Ballarini, R., Gerberich, W.W., Michler, J., Adv. Funct. Mater. 19 (15), 2439 (2009).CrossRefGoogle Scholar
39.Legros, M., Cabié, M., Gianola, D.S., Microsc. Res. Tech. 72 (3), 270 (2009).CrossRefGoogle Scholar
40.Jin, M., Minor, A.M., Stach, E.A., Morris, J.J.W., Acta Mater. 52 (18), 5381 (2004).CrossRefGoogle Scholar
41.Han, J.H., Saif, M.T.A., Rev. Sci. Instrum. 77, 4 (2006).Google Scholar
42.Haque, M.A., Saif, M.T.A., J. Mater. Res. 20 (7), 1769 (2005).CrossRefGoogle Scholar
43.Rajagopalan, J., Han, J.H., Saif, M.T.A., Science 315, 1831 (March 2007).CrossRefGoogle Scholar
44.Rajagopalan, J., Han, J.H., Saif, M.T.A., Scr. Mater. 59, 734 (2008).CrossRefGoogle Scholar
45.Legros, M., Hemker, K.J., Gouldstone, A., Suresh, S., Keller-Flaig, R.M., Arzt, E., Acta Mater. 50 (13), 3435 (2002).CrossRefGoogle Scholar
46.Legros, M., Relaxation plastique des couches métalliques par dislocations et défauts étendus, in Contraintes mécaniques en micro, nano et optoélectronique (Traité EGEM, série Electronique et microélectronique), Mouis, M., Ed. (Hermes Science Publications, Paris, 2006).Google Scholar
47.Zhu, Y., Corigliano, A., Espinosa, H.D., J. Micromech. Microeng. 16, 242 (2006).CrossRefGoogle Scholar
48.Minor, A.M., Asif, S.A.S., Shan, Z.W., Stach, E.A., Cyrankowski, E., Wyrobek, T.J., Warren, O.L., Nat. Mater. 5 (9), 697 (2006).CrossRefGoogle Scholar
49.Zhu, T., Li, J., Ogata, S., Yip, S., MRS Bull. 34 (3), 167 (2009).CrossRefGoogle Scholar
50.Chu, T.C., Ranson, W.F., Sutton, M.A., Peters, W.H., Exp. Mech. 25 (3), 232 (1985).CrossRefGoogle Scholar
51.Sutton, M.A., Li, N., Joy, D.C., Reynolds, A.P., Li, X., Exp. Mech. 47 (6), 775 (2007).CrossRefGoogle Scholar
52.Caillard, D., Mompiou, F., Legros, M., Acta Mater. 57 (8), 2390 (2009).CrossRefGoogle Scholar
53.Mompiou, F., Caillard, D., Legros, M., Acta Mater. 57 (7), 2198 (2009).CrossRefGoogle Scholar
54.HHÿtch, M.J., Putaux, J.-L., Pénisson, J.-M., Nature 425, 270 (2003).CrossRefGoogle Scholar
55.Hÿtch, M.J., Houdellier, F., Hüe, F., Snoeck, E., Nature 453, 1086 (2008).CrossRefGoogle Scholar
56.Uchic, M., Shade, P., Dimiduk, D., JOM 61 (3), 36 (2009).CrossRefGoogle Scholar
57.Brenner, S.S., J. Appl. Phys. 27 (12), 1484 (1956).CrossRefGoogle Scholar
58.Bei, H., Gao, Y.F., Shim, S., George, E.P., Pharr, G.M., Phys. Rev. B: Condens. Matter 77 (6), 060103 (2008).CrossRefGoogle Scholar
59.Norfleet, D.M., Dimiduk, D.M., Polasik, S.J., Uchic, M.D., Mills, M.J., Acta Mater. 56 (13), 2988 (2008).CrossRefGoogle Scholar
60.Motz, C., Weygand, D., Senger, J., Gumbsch, P., Acta Mater. 56 (9), 1942 (2008).CrossRefGoogle Scholar
61.Dehm, G., Legros, M., Heiland, B., J. Mater. Sci. 41, 4484 (2006).CrossRefGoogle Scholar
62.Oh, S.H., Legros, M., Kiener, D., Dehm, G., Nat. Mater. 8, 95 (2009).CrossRefGoogle Scholar
63.Richter, G., Hillerich, K., Gianola, D.S., Mönig, R., Kraft, O., Volkert, C.A., Nano Lett. 9 (8), 3048 (2009).CrossRefGoogle Scholar
64.Ogata, S., Li, J., Hirosaki, N., Shibutani, Y., Yip, S., Phys. Rev. B: Condens. Matter 70 (10), (2004).CrossRefGoogle Scholar
65.Brenner, S.S., J. Appl. Phys. 28 (9), 1023 (1957).CrossRefGoogle Scholar
66.Cahn, J.W., Taylor, J.E., Acta Mater. 52 (16), 4887 (2004).CrossRefGoogle Scholar
67.Cahn, J.W., Mishin, Y., Suzuki, A., Acta Mater. 54 (19), 4953 (2006).CrossRefGoogle Scholar
68.Gianola, D.S., Eberl, C., JOM 61 (3), 24 (2009).CrossRefGoogle Scholar