Hostname: page-component-cd9895bd7-p9bg8 Total loading time: 0 Render date: 2024-12-25T13:03:26.982Z Has data issue: false hasContentIssue false
  • English
  • Français

Quantifying SERS enhancements

Published online by Cambridge University Press:  09 August 2013

Eric C. Le Ru  and
Pablo G. Etchegoin
Eric C. Le Ru
Affiliation:
School of Chemical and Physical Sciences, MacDiarmid Institute for Advanced Materials and Nanotechnology, Victoria University of Wellington, New Zealand; [email protected]
Pablo G. Etchegoin
Affiliation:
School of Chemical and Physical Sciences, MacDiarmid Institute for Advanced Materials and Nanotechnology, Victoria University of Wellington, New Zealand
Get access

Abstract

We provide a review of the main aspects related to surface-enhanced Raman scattering (SERS) enhancement factors (EFs), from their origins to the important issue of their practical quantification. The discussion also focuses on correcting some long-held misconceptions regarding the EFs in SERS, which still persist through the literature. We explain the main topics in simple terms, aiming at clarification of basic concepts rather than an in-depth overview of the already existing literature.

Keywords

Raman spectroscopynanostructuresensormetalcolloid
Type
Research Article
Information
MRS Bulletin , Volume 38 , Issue 8: Surface-enhanced Raman spectroscopy: Substrates and materials , August 2013 , pp. 631 - 640
Copyright
Copyright © Materials Research Society 2013 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Le Ru, E.C., Etchegoin, P.G., Principles of Surface-Enhanced Raman Spectroscopy and Related Plasmonic Effects (Elsevier, Amsterdam, 2009).Google Scholar
Aroca, R.F., Surface-Enhanced Vibrational Spectroscopy (Wiley, Chichester, 2006).CrossRefGoogle Scholar
Moskovits, M., Rev. Mod. Phys. 57, 783 (1985).CrossRefGoogle Scholar
Fleischmann, M., Hendra, P.J., McQuillan, A.J., Chem. Phys. Lett. 26, 163 (1974).CrossRefGoogle Scholar
Jeanmaire, D.L., Van Duyne, R.P., J. Electroanal. Chem. 84, 1 (1977).CrossRefGoogle Scholar
Albrecht, M.G., Creighton, J.A., J. Am. Chem. Soc. 99, 5215 (1977).CrossRefGoogle Scholar
McQuillan, A.J., Notes Records R. Soc. 63, 105 (2009).CrossRefGoogle Scholar
Creighton, J.A., Notes Records R. Soc. 64, 175 (2009).CrossRefGoogle Scholar
Moskovits, M., Notes Records R. Soc. 66, 195 (2012).CrossRefGoogle Scholar
Le Ru, E.C., Blackie, E., Meyer, M., Etchegoin, P.G., J. Phys. Chem. C 111, 13794 (2007).CrossRefGoogle Scholar
Otto, A., Surface-Enhanced Raman Scattering: Classical and Chemical Origins (Springer-Verlag, Berlin, 1984), p. 289.Google Scholar
Kneipp, K., Wang, Y., Kneipp, H., Itzkan, I., Dasari, R.R., Feld, M.S., Phys. Rev. Lett. 76, 2444 (1996).CrossRefGoogle Scholar
Maher, R.C., Galloway, C.M., Le Ru, E.C., Cohen, L.F., Etchegoin, P.G., Chem. Soc. Rev. 37, 965 (2008).CrossRefGoogle Scholar
Le Ru, E.C., Etchegoin, P.G., Annu. Rev. Phys. Chem. 63, 65 (2012).CrossRefGoogle Scholar
Pieczonka, N.P.W., Aroca, R.F., Chem. Soc. Rev. 37, 946 (2008).CrossRefGoogle Scholar
Etchegoin, P.G., Le Ru, E.C., Phys. Chem. Chem. Phys. 10, 6079 (2008).CrossRefGoogle Scholar
Nie, S., Emory, S.R., Science 275, 1102 (1997).CrossRefGoogle Scholar
Kneipp, K., Wang, Y., Kneipp, H., Perelman, L.T., Itzkan, I., Dasari, R.R., Feld, M.S., Phys. Rev. Lett. 78, 1667 (1997).CrossRefGoogle Scholar
Jackson, J.D., Classical Electrodynamics, 2nd ed. (Wiley, New York, 1998).Google Scholar
Schatz, G.C., Young, M.A., Van Duyne, R.P., Top. Appl. Phys. 103, 19 (2006).CrossRefGoogle Scholar
Etchegoin, P.G., Le Ru, E.C., in Surface Enhanced Raman Spectroscopy: Analytical, Biophysical and Life Science Applications (Wiley-VCH, Weinheim, 2011), pp. 1–37.Google Scholar
Xu, H., Bjerneld, E.J., Käll, M., Börjesson, L., Phys. Rev. Lett. 83, 4357 (1999).CrossRefGoogle Scholar
Xu, H.X., Aizpurua, J., Käll, M., Apell, P., Phys. Rev. E 62, 4318 (2000).CrossRefGoogle Scholar
Le Ru, E.C., Etchegoin, P.G., Meyer, M., J. Chem. Phys. 125, 204701 (2006).CrossRefGoogle Scholar
Boyack, R., Le Ru, E.C., Phys. Chem. Chem. Phys. 11, 7398 (2009).CrossRefGoogle Scholar
Landau, L.D., Lifshitz, E.M., Pitaevski, L.P., Electrodynamics of Continuous Media, 2nd ed. (Elsevier, Amsterdam, 2004).Google Scholar
Le Ru, E.C., Etchegoin, P.G., Chem. Phys. Lett. 413, 63 (2006).CrossRefGoogle Scholar
Lombardi, J.R., Birke, R.L., Lu, T., Xu, J., J. Chem. Phys. 84, 4174 (1986).CrossRefGoogle Scholar
Lombardi, J.R., Birke, R.L., J. Phys. Chem. C 112, 5605 (2008).CrossRefGoogle Scholar
King, F.W., Duyne, R.P.V., Schatz, G.C., J. Chem. Phys. 69, 4472 (1978).CrossRefGoogle Scholar
Efrima, S., Metiu, H., J. Chem. Phys. 70, 1602 (1979).CrossRefGoogle Scholar
dos Santos, D.P., Andrade, G.F.S., Temperini, M.L.A., Brolo, A.G., J. Phys. Chem. C 113, 17737 (2009).CrossRefGoogle Scholar
Le Ru, E.C., Meyer, S.A., Artur, C., Etchegoin, P.G., Grand, J., Lang, P., Maurel, F., Chem. Commun. 47, 3903 (2011).CrossRefGoogle Scholar
Moskovits, M., J. Chem. Phys. 77, 4408 (1982).CrossRefGoogle Scholar
Le Ru, E.C., Meyer, M., Blackie, E., Etchegoin, P.G., J. Raman Spectrosc. 39, 1127 (2008).CrossRefGoogle Scholar
Le Ru, E.C., Grand, J., Félidj, N., Aubard, J., Lévi, G., Hohenau, A., Krenn, J.R., Blackie, E., Etchegoin, P.G., J. Phys. Chem. C 112, 8117 (2008).CrossRefGoogle Scholar
Schröetter, H.W., Klöckner, H.W., Raman Scattering Cross Sections in Gases and Liquids (Springer, Berlin, 1979), pp. 123–166.Google Scholar
Hildebrandt, P., Stockburger, M., J. Phys. Chem. 88, 5935 (1984).CrossRefGoogle Scholar
Cai, W.B., Ren, B., Li, X.Q., She, C.X., Liu, F.M., Cai, X.W., Tian, Z.Q., Surf. Sci. 406, 9 (1998).CrossRefGoogle Scholar
Félidj, N., Aubard, J., Lévi, G., Krenn, J.R., Salerno, M., Schider, G., Lamprecht, B., Leitner, A., Aussenegg, F.R., Phys. Rev. B 65, 075419 (2002).CrossRefGoogle Scholar
McFarland, A.D., Young, M.A., Dieringer, J.A., Van Duyne, R.P., J. Phys. Chem. B 109, 11279 (2005).CrossRefGoogle Scholar
Laurence, T.A., Braun, G.B., Reich, N.O., Moskovits, M., Nano Lett. 12, 2912 (2012).CrossRefGoogle Scholar
Kuramitz, H., Sugawara, K., Kawasaki, M., Hasebe, K., Nakamura, H., Tanaka, S., Anal. Sci. 15, 589 (1999).CrossRefGoogle Scholar
Shim, S., Stuart, C.M., Mathies, R.A., ChemPhysChem 9, 697 (2008).CrossRefGoogle Scholar
Le Ru, E.C., Schroeter, L.C., Etchegoin, P.G., Anal. Chem. 84, 5074 (2012).CrossRefGoogle Scholar
Auguie, B., Reigue, A., Le Ru, E.C., Etchegoin, P.G., Anal. Chem. 84, 7938 (2012).CrossRefGoogle Scholar
Reigue, A., Auguie, B., Etchegoin, P.G., Le Ru, E.C., J. Raman Spectrosc. 44, 573 (2013).CrossRefGoogle Scholar
Le Ru, E.C., Etchegoin, P.G., J. Chem. Phys. 130, 181101 (2009).CrossRefGoogle Scholar
Le Ru, E.C., Grand, J., Sow, I., Somerville, W.R.C., Etchegoin, P.G., Treguer-Delapierre, M., Charron, G., Félidj, N., Lévi, G., Aubard, J., Nano Lett. 11, 5013 (2011).CrossRefGoogle Scholar
Le Ru, E.C., Meyer, M., Etchegoin, P.G., J. Phys. Chem. B 110, 1944 (2006).CrossRefGoogle Scholar
Etchegoin, P.G., Meyer, M., Blackie, E., Le Ru, E.C., Anal. Chem. 79, 8411 (2007).CrossRefGoogle Scholar
Dieringer, J.A., Lettan, R.B. II, Scheidt, K.A., Van Duyne, R.P., J. Am. Chem. Soc. 129, 16249 (2007).CrossRefGoogle Scholar
Blackie, E., Le Ru, E.C., Meyer, M., Timmer, M., Burkett, B., Northcote, P., Etchegoin, P.G., Phys. Chem. Chem. Phys. 10, 4147 (2008).CrossRefGoogle Scholar
Kleinman, S.L., Ringe, E., Valley, N., Wustholz, K.L., Phillips, E., Scheidt, K.A., Schatz, G.C., Van Duyne, R.P., J. Am. Chem. Soc. 133, 4115 (2011).CrossRefGoogle Scholar
Steidtner, J., Pettinger, B., Phys. Rev. Lett. 100, 236101 (2008).CrossRefGoogle Scholar
Pettinger, B., Mol. Phys. 108, 2039 (2010).CrossRefGoogle Scholar
Sonntag, M., Klingsporn, J., Garibay, L., Roberts, J., Dieringer, J., Scheidt, K., Jensen, L., Schatz, G.C., Seideman, T., Van Duyne, R.P., J. Phys. Chem. C 116, 478 (2012).CrossRefGoogle Scholar
Blackie, E.J., Le Ru, E.C., Etchegoin, P.G., J. Am. Chem. Soc. 131, 14466 (2009).CrossRefGoogle Scholar
Fang, Y., Seong, N.-H., Dlott, D.D., Science 321, 388 (2008).CrossRefGoogle Scholar
Etchegoin, P.G., Lacharmoise, P.D., Le Ru, E.C., Anal. Chem. 81, 682 (2009).CrossRefGoogle Scholar
Lee, P.C., Meisel, D., J. Phys. Chem. 86, 3391 (1982).CrossRefGoogle Scholar
Moskovits, M., Suh, J.S., J. Chem. Phys. 77, 4408 (1982).CrossRefGoogle Scholar
Moskovits, M., Suh, J.S., J. Phys. Chem. 92, 6327 (1988).CrossRefGoogle Scholar
Fazio, B., DAndrea, C., Bonaccorso, F., Irrera, A., Calogero, G., Vasi, C., Gucciardi, P.G., Allegrini, M., Toma, A., Chiappe, D., Martella, C., Buatier de Mongeot, F., ACS Nano 5, 5945 (2011).CrossRefGoogle Scholar
Wei, H., Hao, F., Huang, Y., Wang, W., Nordlander, P., Xu, H., Nano Lett. 8, 2497 (2008).CrossRefGoogle Scholar
Shegai, T., Li, Z., Dadosh, T., Zhang, Z., Xu, H., Haran, G., Proc. Nat. Acad. Sci. 105, 16448 (2008).CrossRefGoogle Scholar
Chu, Y., Zhu, W., Wang, D., Crozier, K.B., Opt. Express 19, 20054 (2011).CrossRefGoogle Scholar
Zhang, Y., Barhoumi, A., Lassiter, J.B., Halas, N.J., Nano Lett. 11, 1838 (2011).CrossRefGoogle Scholar
Ahmed, A., Gordon, R., Nano Lett. 11, 1800 (2011).CrossRefGoogle Scholar
Ahmed, A., Gordon, R., Nano Lett. 12, 2625 (2012).CrossRefGoogle Scholar
Coenen, T., Vesseur, E.J., Polman, A., Koenderink, A.F., Nano Lett. 11, 3779 (2011).CrossRefGoogle Scholar
Kosako, T., Kadoya, Y., Hofmann, H.F., Nat. Photon. 4, 312 (2010).CrossRefGoogle Scholar
Zhu, W., Wang, D., Crozier, K.B., Nano Lett. 12, 6235 (2012).CrossRefGoogle Scholar
Meyer, S.A., Le Ru, E.C., Etchegoin, P.G., Anal. Chem. 83, 2337 (2011).CrossRefGoogle Scholar
Meyer, S.A., Auguie, B., Le Ru, E.C., Etchegoin, P.G., J. Phys. Chem. A 116, 1000 (2012).CrossRefGoogle Scholar
Le Ru, E.C., Etchegoin, P.G., Grand, J., Félidj, N., Aubard, J., Lévi, G., J. Phys. Chem. C 111, 16076 (2007).CrossRefGoogle Scholar
Gill, R., Le Ru, E.C., Phys. Chem. Chem. Phys. 13, 16366 (2011).CrossRefGoogle Scholar
Gill, R., Tian, L., Somerville, W.R.C., Le Ru, E.C., van Amerongen, H., Subramaniam, V., J. Phys. Chem. C 116, 16687 (2012).CrossRefGoogle Scholar
Galloway, C.M., Etchegoin, P.G., Le Ru, E.C., Phys. Rev. Lett. 103, 063003 (2009).CrossRefGoogle Scholar
Mahajan, S., Cole, R.M., Speed, J.D., Pelfrey, S.H., Russell, A.E., Bartlett, P.N., Barnett, S.M., Baumberg, J.J., J. Phys. Chem. C 114, 7242 (2010).CrossRefGoogle Scholar
Hugall, J.T., Baumberg, J.J., Mahajan, S., J. Phys. Chem. C 116, 6184 (2012).CrossRefGoogle Scholar
Lee, A., Andrade, G.F.S., Ahmed, A., Souza, M.L., Coombs, N., Tumarkin, E., Liu, K., Gordon, R., Brolo, A.G., Kumacheva, E., J. Am. Chem. Soc. 133, 7563 (2011).CrossRefGoogle Scholar