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Materials Analysis with High Energy Ion Beams Part II: Channeling and Other Techniques

Published online by Cambridge University Press:  29 November 2013

H-J. Gossmann  and
L.C. Feldman
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Abstract

This article discusses uses of high energy ion beam scattering for materials analysis, including channeling, particle induced x-ray emission (PIXE), and nuclear reaction analysis (NRA). These additional capabilities used in conjunction with RBS equipment provide capabilities for crystalline defect studies and light element detection.

Type
Materials Microanalysis
Information
MRS Bulletin , Volume 12 , Issue 6 , September 1987 , pp. 30 - 34
Copyright
Copyright © Materials Research Society 1987

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