Hostname: page-component-78c5997874-dh8gc Total loading time: 0 Render date: 2024-11-19T06:05:08.787Z Has data issue: false hasContentIssue false
  • English
  • Français

In Situ Magnetic-Circular-X-Ray-Dichroism Measurements: An Epitaxial Fe Wedge on Cu(100)

Published online by Cambridge University Press:  29 November 2013

M.E. Dávila ,
D. Arvanitis ,
J. Hunter Dunn ,
N. Mårtensson ,
P. Srivastava ,
F. Wilhelm  and
K. Baberschke
Get access

Extract

Circularly polarized x-ray radiation is attracting increasing interest as a tool for the characterization of the electronic, magnetic, and chiral properties of low-dimensional structures. Using circular light (with electric field vector parallel to the orbital plane), a dependence of the measured quantity by changing either the orientation of the light polarization or the magnetization is indicative of the existence of magnetic circular dichroism. It can be observed in x-ray absorption spectroscopy (XAS), in which the photon energy is scanned through an absorption threshold exciting a core electron into an unoccupied valence state using circularly polarized light. Synchrotron radiation sources have made this technique possible. It can also be observed in photo-emission spectroscopy from core and valence levels. Here we focus on magnetic circular x-ray dichroism (MCXD) in XAS as an element-specific tool to investigate magnetic properties of ultrathin films in situ. The application of magneto-optical sum rules enables the determination of the orbital and spin magnetic moments per atom from XAS spectra, as well as the easy magnetization direction.

MCXD-based magnetometry in XAS is extensively used by measuring the L absorption edges of 3d-transition metals, where large intensity changes (up to 60%) of the L-edge white lines are observed upon reversal of either the sample magnetization or the light helicity. The high magnetic contrast obtained, combined with the elemental specificity of the technique, allows for the study of very dilute samples such as ultrathin films. We first concentrate on the selection rules governing MCXD in XAS.

Type
In Situ Synchrotron Radiation Research in Materials Science
Information
MRS Bulletin , Volume 24 , Issue 1 , January 1999 , pp. 41 - 45
Copyright
Copyright © Materials Research Society 1999

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Lovesey, S.W. and Collins, S.P., X-Ray Scattering and Absorption by Magnetic Materials (Clarendon Press, Oxford, 1996).CrossRefGoogle Scholar
2.Brouder, C. and Kappler, J-P., in Magnetism and Synchrotron Radiation, edited by Beaurepaire, E., Carrière, B., and Kappler, J-P. (Les Editions de Physique, Les Ulis, France, 1997) p. 19; M. Altarelli and P. Sainctavit, Magnetism and Synchrotron Radiation p. 65 and references therein.Google Scholar
3.Carra, P., Thole, B.T., Altarelli, M., and Wang, X., Phys. Rev. Lett. 70 (1993) p. 694.CrossRefGoogle Scholar
4.Thole, B.T., Carra, P., Sette, F., and van der Laan, G., Phys. Rev. Lett. 68 (1992) p. 1943.CrossRefGoogle Scholar
5.Arvanitis, D., Tischer, M., Dunn, J. Hunter, May, F., Mårtensson, N., and Baberschke, K., in Spin Orbit Spectroscopies of Magnetic Solids, vol. 466, Springer Lecture Notes in Physics, edited by Ebert, H. and Schütz, G. (Springer-Verlag, Berlin, 1996) p. 145.CrossRefGoogle Scholar
6.Smith, N.V. and Padmore, H.A., MRS Bulletin, Vol. 20, No. 10; Oct. 1995, p. 41.CrossRefGoogle Scholar
7.Dunn, J. Hunter, Arvanitis, D., Mårtensson, N., Tischer, M., May, F., Russo, M., and Baberschke, K., J. Phys. Cond. Matter 7 (1995) p. 1111.CrossRefGoogle Scholar
8.Dunn, J. Hunter, Arvanitis, D., Mårtensson, N., Phys. Rev. B 54 (1996) p. R11157.CrossRefGoogle Scholar
9.Müller, S., Bayer, P., Reischl, C., Heinz, K., Feldmann, B., Zillgen, H., and Wuttig, M., Phys. Rev. Lett. 74 (1995) p. 765.CrossRefGoogle Scholar
10.Li, D., Freitag, M., Pearson, J., Qiu, Z.Q., and Bader, S.D., Phys. Rev. Lett. 72 (1994) p. 3112.CrossRefGoogle Scholar
11.Asada, T. and Blügel, S., Phys. Rev. Lett. 79 (1997) p. 507.CrossRefGoogle Scholar
12.Zhou, Y., Zhang, W., Zhong, L., and Wang, D., J. Magn. Magn. Mater. 145 (1995) p. L273.CrossRefGoogle Scholar
13.Allenspach, R. and Bischof, A., Phys. Rev. Lett. 69 (1992) p. 3385.CrossRefGoogle Scholar
14.Zak, J., Moog, E.R., Liu, C., and Bader, S., Magn. Magn. Mater. 89 (1990) p. 107.CrossRefGoogle Scholar
15.Zharnikov, M., Dittschar, A., Kuch, W., Schneider, C.M., and Kirschner, J., Phys. Rev. Lett. 76 (1996) p. 4620.CrossRefGoogle Scholar