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Elastic Anomalies in Superlattices

Published online by Cambridge University Press:  29 November 2013

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The presence and origin of elastic anomalies in superlattices, interfaces, composites, and nanocrystalline materials has been a subject of much interest and controversy in recent years. In particular, superlattices are being used as model systems to study the effect of interfaces on the mechanical properties of novel materials. Early claims of anomalously large enhancements of the biaxial and flexural moduli of Au/Ni and Cu/Ni superlattices (“supermodulus effect”) created considerable controversy and contradictory reports in the experimental and theoretical literature. To understand the mechanical properties of superlattices and their implication for other types of nanofabricated materials, it is important to look critically at the field.

Superlattices have been fabricated in different laboratories by a variety of preparation methods and have been characterized structurally and elastically to various degrees. Because of this, before addressing any sophisticated theoretical issues regarding elastic anomalies, it is important to understand in detail the experimental techniques and the possible pitfalls in the experimental determination of mechanical properties of thin films. Once the presence or absence of the effect is ascertained, the need arises to understand any possible experimental correlations with other structural and/or physical properties. These correlations can be used to address issues regarding the possible origins of the effect and their theoretical basis. It will be apparent from this article that slight changes in structural properties are correlated with relatively large elastic anomalies. Consequently, this points to the importance of precise, comprehensive, and detailed structural characterization. With our present understanding of the physics of superlattices, qualitative studies are no longer sufficient!

Type
Interfaces Part II
Copyright
Copyright © Materials Research Society 1990

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References

1. See for instance Schuller, I.K., IEEE Ultrasonics Symposium, edited by McAvoy, B.R. (IEEE, New York, 1985), and M. Grimsditch, Chapter in Light Scattering in Solids V, edited by M. Cardona and G. Guntherodt (Springer, Heidelberg, 1989).Google Scholar
2. For a recent review see Brandt, Richard G., Mater. Sci. Eng. B6 (1990) p. 95 and references therein.CrossRefGoogle Scholar
3. For a review of the original work see Hilliard, J.E., AIP Conf. Proc. 53 (1979) p. 407.CrossRefGoogle Scholar
4.Tsakalakos, T. and Hilliard, J.E., J. Appl. Phys. 54 (1982) p. 734.CrossRefGoogle Scholar
5.Yang, W.M.C., Tsakalakos, T., and Hilliard, J.E., J. Appl. Phys. 48 (1977) p. 876.CrossRefGoogle Scholar
6.Barmatz, M., Testardi, L.R., and DiSalvo, F.J., Phys. Rev. B 12 (1975) p. 4367, and B.S. Berry and W.C. Pritchet, IBM J. Res. Develop. 19 (1975) p. 334.CrossRefGoogle Scholar
7.Fartash, A., Schuller, I.K., and Grimsditch, M., Appl. Phys. Lett. 55 (1990) p. 2614.CrossRefGoogle Scholar
8.Moreau, A., Ketterson, J.B., and Davis, B.C., J. Appl. Phys., to be published.Google Scholar
9.Sandercock, J. in Light Scattering in Solids III from Topics in Applied Physics, Vol. 51, edited by Cardona, M. and Guntherodt, G., (Springer, NY, 1982).CrossRefGoogle Scholar
10.Clemens, B. and Eesley, G., Phys. Rev. Lett. 61 (1988) p. 2356.CrossRefGoogle Scholar
11.Danner, R., Huebener, R.P., Chun, C.S.L., Grimsditch, M., and Schuller, Ivan K., Phys. Rev. B 33 (1986) p. 3696.CrossRefGoogle Scholar
12.Bower, R.J., Appl. Phys. Lett. 23 (1973) p. 99, and C.Y. Ting and B.L. Crowder, J. Electrochem. Soc. 129 (1982) p. 2590.CrossRefGoogle Scholar
13. See for instance Localization, Interaction and Transport Phenomena, edited by Kramer, B., Bermann, G., and Bruynseraede, Y., (Springer Series in Solid State Sciences, 39, 1985) p. 221.CrossRefGoogle Scholar
14.Schuller, I.K. and Rahman, A., Phys. Rev. Lett. 50 (1983) p. 1377.CrossRefGoogle Scholar
15. For a recent review of the determination of structure from x-ray diffraction studies see the chapter by McWhan, D.B., in Physics, Fabrication and Applications of Multilayered Structures, edited by Dhez, P. and Weisbuch, C. (Plenum Press, New York, 1989) p. 67.Google Scholar
16. For an early review see McWan, D.B. in Synthetically Modulated Structures, edited by Chang, L.L. and Giessen, B.C. (Academic Press, New York, 1985).Google Scholar
17. See for instance Prinz, G., MRS BULLETIN, XIII (6) (1988) p. 28.CrossRefGoogle Scholar
18. See for instance Yang, K.Y., Homma, H., and Schuller, I.K., J. Appl. Phys. 63 (1988) p. 4066.CrossRefGoogle Scholar
19.Schuller, I.K. and Grimsditch, M., J. Vac. Sci. Technol. B 4 (1986) p. 1444.CrossRefGoogle Scholar
20.Berry, B.S. and Pritchet, W.C., Thin Solid Films 33 (1976) p. 191.CrossRefGoogle Scholar
21.Itozaki, H.I., thesis, Northwestern University (1982) (unpublished).Google Scholar
22.Testardi, L.R., Willens, R.M., Krause, J.T., McWhan, D.B., and Nakahara, S., J. Appl. Phys. 52 (1981) p. 510.CrossRefGoogle Scholar
23.Moreau, A., Ketterson, J.B., and Mattson, J., J. Appl. Phys. Lett., to be published.Google Scholar
24.Mattson, J., Bhadra, R., Ketterson, J.B., Brodsky, M.B., and Grimsditch, M., J. Appl. Phys. 67 (1990) p. 2873.CrossRefGoogle Scholar
25.Dutcher, J.R., Lee, S., Kim, J., Stegeman, G., and Falco, C.M., Mater. Res. Soc. Symp. Proc. (in press), J. Mater. Sci. Eng. A 127 (in press) and J. Mater. Sci. Eng. B 6 (in press).Google Scholar
26.Kueny, A., Grimsditch, M., Miyano, K., Banerjee, I., Falco, C.M., and Schuller, I.K., Phys. Rev. Lett. 48 (1982) p. 166.CrossRefGoogle Scholar
27.Bell, J.A., Bennett, W.R., Zanoni, R., Stegeman, G.I., Falco, C.M., and Seaton, C.T., Sol. St. Comm. 64 (1987) p. 1339.CrossRefGoogle Scholar
28.Khan, R., Chun, C.S.L., Felcher, C.P., Grimsditch, M., Kueny, A., Falco, C.M., and Schuller, Ivan K., Phys. Rev. B 27 (1983) p. 7186.CrossRefGoogle Scholar
29.Hues, S.M., Bhadra, R., Grimsditch, M., Fullerton, E., and Schuller, Ivan K., Phys. Rev. B 39 (1989) p. 12966.CrossRefGoogle Scholar
30.Fullerton, E., Hues, S., Grimsditch, M., and Schuller, I.K. (to be published).Google Scholar
31.Pickett, W.E., J. Phys. F 12 (1982) p. 2195.CrossRefGoogle Scholar
32.Wu, T.B., J. Appl. Phys. 53 (1982) p. 5265.CrossRefGoogle Scholar
33.Jankowski, A.F. and Tsakalakos, T., J. Phys. F 15 (1985) p. 1279.CrossRefGoogle Scholar
34.Huberman, M.L. and Grimsditch, M., Phys. Rev. Lett. 62 (1989) p. 1403.CrossRefGoogle Scholar
35.Cammarata, R.C. and Sieradzki, K., Phys. Rev. Lett. 62 (1989) p. 2005.CrossRefGoogle Scholar
36. See for instance, Wolf, D. and Lutsko, J.F., J. Appl. Phys. 66 (1989) p. 1961.CrossRefGoogle Scholar
37.Banerjea, A. and Smith, J.R., Phys. Rev. B 35 (1987) p. 5413.CrossRefGoogle Scholar
38.Bisanti, P., Brodsky, M.B., Felcher, C.P., Grimsditch, M., and Sill, L.R., Phys. Rev. B 35 (1987) p. 7813.CrossRefGoogle Scholar