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Cryogenic specimens for nanoscale characterization of solid–liquid interfaces

Published online by Cambridge University Press:  10 December 2019

Michael J. Zachman ,
Niels de Jonge ,
Robert Fischer ,
Katherine L. Jungjohann  and
Daniel E. Perea
Michael J. Zachman
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, USA; [email protected]
Niels de Jonge
Affiliation:
INM–Leibniz Institute for New Materials, Germany; [email protected]
Robert Fischer
Affiliation:
The University of Oregon, USA; [email protected]
Katherine L. Jungjohann
Affiliation:
Center for Integrated Nanotechnologies, Sandia National Laboratories, USA; [email protected]
Daniel E. Perea
Affiliation:
Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory, USA; [email protected]
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Abstract

New cryogenic characterization techniques for exploring the nanoscale structure and chemistry of intact solid–liquid interfaces have recently been developed. These techniques provide high-resolution information about buried interfaces from large samples or devices that cannot be obtained by other means. These advancements were enabled by the development of instrumentation for cryogenic focused ion beam liftout, which allows intact solid–liquid interfaces to be extracted from large samples and thinned to electron-transparent thicknesses for characterization by cryogenic scanning transmission electron microscopy or atom probe tomography. Future implementation of these techniques will complement current strides in imaging of materials in fluid environments by in situ liquid-phase electron microscopy, providing a more complete understanding of the morphology, surface chemistry, and dynamic processes that occur at solid–liquid interfaces.

Type
Cryogenic Electron Microscopy in Materials Science
Information
MRS Bulletin , Volume 44 , Issue 12: Cryogenic Electron Microscopy in Materials Science , December 2019 , pp. 949 - 955
Copyright
Copyright © Materials Research Society 2019 

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