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Capped Nanoparticles as Potential Electronic Components with Nanoscale Dimensions

Published online by Cambridge University Press:  03 May 2012

David J. Schiffrin
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Extract

Nanotechnology, a much abused term, refers to the fabrication and assembly of functional objects of nanometer dimensions. In this article, we will refer only to specific aspects of chemical nanotechnology, meaning by this the production of structures of nanometer dimensions by chemical means. In particular, we will center the discussion on the use of metal nanoparticles as chemical building blocks.

Type
Research Article
Information
MRS Bulletin , Volume 26 , Issue 12: New Aspects in Nanocrystal Research , December 2001 , pp. 1015 - 1019
Copyright
Copyright © Materials Research Society 2001

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References

1.Faraday's Diary, Vol.VII, The Royal Institution of Great Britain, edited by Martin, T. (Bell and Sons, London, 1936).Google Scholar
2.Collier, C.P.Vossmeyer, T. and Heath, J.R.Annu. Rev. Phys. Chem. 49 (1998) p. 371; Nano-particles and Nanostructured Films, edited by J.H. Fendler (Wiley-VCH, Weinheim, 1998).CrossRefGoogle Scholar
3.Feldheim, D. and Keating, C.D.Chem. Soc. Rev. 27 (1998) p. 1; C.N.R., Rao, G.U., Kulkarni, P.J., Thomas and P.P., Edwards Chem. Soc. Rev. 29 (2000) p.27.CrossRefGoogle Scholar
4.Badia, A.Lennox, R.B. and Reven, L.Acc. Chem. Res. 33 (2000) p.475.CrossRefGoogle Scholar
5.Shipway, A.N.Katz, E. and Willner, I.Chem PhysChem 1 (2000) p.18.Google Scholar
6.Templeton, A.C.Wuelfing, M.P. and Murray, R.W.Acc. Chem. Res. 33 (2000) p.27.CrossRefGoogle Scholar
7.Ji, M.Chen, X.Wai, C.M. and Fulton, J.L.J.Am. Chem. Soc. 121 (1999) p.2631.CrossRefGoogle Scholar
8.Cason, J.P. and Roberts, C.B.J. Phys. Chem. B 104 (2000) p.1217.CrossRefGoogle Scholar
9.Lisiecki, I. and Pileni, M.P.J. Phys. Chem. 99 (1995) p.5077.CrossRefGoogle Scholar
10.Shah, P.S.Holmes, J.D.Doty, R.C.Johnston, K.P. and Korgel, B.A.J.Am. Chem. Soc. 122 (2000) p.4245.CrossRefGoogle Scholar
11.Cason, J.P.Khambaswadkar, K. and Roberts, C.B.Ind. Eng. Chem. Res. 39 (2000) p. 4749.CrossRefGoogle Scholar
12.Dimitrijevic, N.M.Bartels, D.M.Jonah, C.D.Takahashi, K. and Rajh, T.J. Phys Chem. B 105 (2001) p.954.CrossRefGoogle Scholar
13.Clarke, N.Z.Waters, C.Johnson, K.A.Satherley, J., and Schiffrin, D.J.Langmuir 17 (2001) p.6048.CrossRefGoogle Scholar
14.Bottcher, C.J.F.Theory of Electronic Polarisation (Elsevier Scientific, Amsterdam, 1973) p.86.Google Scholar
15.Shon, Y.-S.Gross, S.M.Dawson, B.Porter, M. and Murray, R.W.Langmuir 16 (2000) p.6555.CrossRefGoogle Scholar
16.Brust, M.Walker, M.Bethell, D.Schiffrin, D.J. and Whyman, R. Chem. Commun. (1994) p. 801.Google Scholar
17.Yonezawa, T.Yasui, K. and Kimizuka, N.Langmuir 17 (2001) p.271.CrossRefGoogle Scholar
18.Ingram, R.S.Hostetler, M.J. and Murray, R.W.J.Am. Chem. Soc. 119 (1997) p.9175.CrossRefGoogle Scholar
19.Shon, Y.-S.Wuelfing, W.P. and Murray, R.W.Langmuir 17 (2001) p.1255.CrossRefGoogle Scholar
20.Cliffel, D.E.Zamborini, F.P.Gross, S.M. and Murray, R.W.Langmuir 16 (2000) p.9699.CrossRefGoogle Scholar
21.Chen, S.Yao, H. and Kimura, K.Langmuir 17 (2001) p.733.CrossRefGoogle Scholar
22.Kumar, A.Mukherjee, P.Guha, A.Adyantaya, S.D.Mandale, A.B.Kumar, R. and Sastry, M.Langmuir 16 (2000) p.9775.CrossRefGoogle Scholar
23.Schmid, G.Pfeil, R.Boese, R.Bandermann, F.Meyer, S.Calis, G.H.M. and Velden, J.W.A. van der, Chem. Ber. 114 (1981) p.3634.CrossRefGoogle Scholar
24.Weare, W.W.Reed, S.M.Warner, M.G. and Hutchinson, J.E.J. Am. Chem. Soc. 122 (2000) p.12890.CrossRefGoogle Scholar
25.Li, W.M.Pankau, M.R.Verbist, K. and Kiedrowski, G. von, Chem. Commun. (2001) p. 519.Google Scholar
26.Jong, X.-M. de, Inoue, K.Shinkai, S.Huskens, J. and Reinhoudt, D.N.J. Mater. Chem. 11 (2001) p.1919.Google Scholar
27.Heath, J.R.Pure Appl. Chem. 72 (2000) p. 11.CrossRefGoogle Scholar
28.Pease, A.R.Jeppesen, J.O.Stoddart, J.F.Luo, Y.Collier, C.P. and Heath, J.R.Acc. Chem. Res. 34 (2001) p.433.CrossRefGoogle Scholar
29.Bissel, R.A.Cordova, E.Kaifer, A.E. and Stoddart, J.F., Nature 369 (1994) p.133.CrossRefGoogle Scholar
30.Wong, E.W.Collier, C.P.Behloradsky, M.Raymo, F.M.Stoddart, J.F. and Heath, J.R.J.Am. Chem. Soc. 122 (2000) p.5831.CrossRefGoogle Scholar
31.Chen, J.Reed, M.A.Rawlett, A.M. and Tour, J.M., Science 286 (1999) p.1550.CrossRefGoogle Scholar
32.Fendler, J.H.Chem. Mater. 13 (2001) p. 3196.CrossRefGoogle Scholar
33.Andres, R.P.Bein, T.. Dorogi, M.Feng, S.Henderson, J.I.Kubiak, C.P.Mahoney, W.Osifchin, R.G. and Reifenberg, R.Science 272 (1996) p.1323.CrossRefGoogle Scholar
34.Moriarty, P.Rep. Prog. Phys. 64 (2001) p.297.CrossRefGoogle Scholar
35.Wang, B.Wang, H.Li, H.Zeng, C. and Hou, J.G.Phys. Rev. B 63 (2000) p.035403.CrossRefGoogle Scholar
36.Ashoori, R.C.Nature 379 (1996) p.413.CrossRefGoogle Scholar
37.Ingram, R.S.Hostetler, M.J.Murray, R.W.Schaaff, T.G. J.Khoury, Whetten, R.L.Bigiori, T.P.Guthrie, D.K. and First, P.N.J. Am. Chem. Soc. 119 (1997) p.9279.CrossRefGoogle Scholar
38.Chen, S. and Murray, R.W.J. Phys. Chem. B 103 (1999) p.9996.CrossRefGoogle Scholar
39.Chen, S.J. Phys. Chem. B 104 (2000) p. 663.CrossRefGoogle Scholar
40.Baum, T.Bethell, D.Brust, M. and Schiffrin, D.J.Langmuir 15 (1999) p.866.CrossRefGoogle Scholar
41.Davidovic, D. and Tinkham, M.Appl. Phys. Lett. 73 (1998) p.3959.CrossRefGoogle Scholar
42.Sato, T.Ahmed, H.Brown, D. and Johnson, B.F.G.J.Appl. Phys. 82 (1997) p.696.CrossRefGoogle Scholar
43.Bezryadin, A.Dekker, C. and Schmid, G.Appl. Phys. Lett. 71 (1997) p.1273.CrossRefGoogle Scholar
44.Schmid, G.Liu, Y.-P.Schumann, M.Raschke, T. and Radehaus, C. Nano Lett. (2001) in press.Google Scholar
45.Ng, L.N.Zervas, B.F.Luff, B.J. and Wilkinson, J.S.Appl. Phys. Lett. 76 (2000) p.1993.CrossRefGoogle Scholar
46.Gittins, D.Bethell, D.Schiffrin, D.J. and Nichols, R.J.Nature 408 (2000) p.67.CrossRefGoogle Scholar
47.Devoret, M.H. and Schoelfopf, R.J.Nature 406 (2000) p.1039.CrossRefGoogle Scholar
48.Bomchil, G. Grenoble (private communication). The author is grateful to Dr. Bomchil for useful discussions and comments on the ultimate limitations of Si technology.Google Scholar