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Analytical electron tomography

Published online by Cambridge University Press:  07 July 2016

Rowan K. Leary  and
Paul A. Midgley
Rowan K. Leary
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, UK; [email protected]
Paul A. Midgley
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, UK; [email protected]
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Abstract

This article highlights recent advances in analytical electron tomography (AET), the three-dimensional (3D) extension of conventional nanoanalytical techniques, in which electron energy loss, x-ray spectroscopy, and electron diffraction are combined with tomographic acquisition and reconstruction. Examples from the literature illustrate how new 3D information, gleaned from AET, provides insights into not just morphology and composition, but also the electronic, chemical, and optical properties of materials at the nanoscale. We describe how the “multidimensional” nature of AET leads to “big data” sets, how these can be analyzed optimally, and how AET may develop further.

Keywords

scanning transmission electron microscopy (STEM)nanoscaleelectron energy-loss spectroscopy (EELS)x-ray tomographycrystallographic structure
Type
Research Article
Information
MRS Bulletin , Volume 41 , Issue 7: Advanced Tomography Techniques for Materials Applications , July 2016 , pp. 531 - 536
Copyright
Copyright © Materials Research Society 2016 

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