No CrossRef data available.
Article contents
Abnormal Oxidation of TiSi2 in Gate Stacks Found at 750–850°C
Published online by Cambridge University Press: 31 January 2011
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

- Type
- Research/Researchers
- Information
- Copyright
- Copyright © Materials Research Society 2000