Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-23T16:29:14.507Z Has data issue: false hasContentIssue false
  • English
  • Français

Role of Pre-Layer Mo Films in Microstructural and Morphological Properties of Over-Layer CIGS Films

Published online by Cambridge University Press:  13 June 2017

Hamda A. Al-Thani  and
Falah S. Hasoon
Hamda A. Al-Thani*
Affiliation:
National Energy and Water Research Center (NEWRC), POBOX54111, Abu Dhabi, UAE
Falah S. Hasoon
Affiliation:
National Energy and Water Research Center (NEWRC), POBOX54111, Abu Dhabi, UAE
*
*(Email: [email protected])
Get access

Abstract

This study focuses on establishing a microstructural and morphological correlation between CIGS films and its precursor layer of Molybdenum (Mo) coated soda-lime glass (SLG). Therefore, variations in the morphology and microstructural properties of Mo thin films, using DC planar magnetron sputtering, were induced systematically by varying the sputtering pressure from 0.6 to 16 mT with a sputtering power density of 1.2 W/cm2. Subsequently, under fixed deposition conditions (deposition rate and substrate temperature), a growth of Cu(In,Ga)Se2 (CIGS) films was carried out on the Mo-coated SLG substrates, using the 3-stage growth process of the physical vapor deposition (PVD) technique.

High-Resolution Scanning Electron Microscopy (HRSEM) was used to examine the Mo and CIGS films morphology. X-Ray Diffraction (XRD) was applied to study in detail the microstructure of Mo and CIGS films. Where, the films’ crystal structure including the preferred orientation and the lattice parameters were determined by the θ/2θ XRD technique and by applying Cohen’s least-square method. Furthermore, Atomic Force Microscopy (AFM) was used to determine the root-mean-square (RMS) surface roughness of the CIGS films.

Keywords

microstructuremorphologysputtering
Type
Articles
Information
MRS Advances , Volume 2 , Issue 53: Energy Storage and Conversion , 2017 , pp. 3215 - 3224
Copyright
Copyright © Materials Research Society 2017 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Granath, K., Rockett, A, Bodegard, M, Nender, C., and Stolt, L, 13th European Photovoltaic Solar Energy Conference, Nice, France, 1983 (1995).Google Scholar
Scofield, J.H., Duda, A., Albin, D., Ballard, B.L., and Predecki, P.K., Thin Solid Films 260, 26–31 (1995).CrossRefGoogle Scholar
Thornton, J.A., Ann. Rev. Mater. Sci. 7, 239 (1977).Google Scholar
Drusedau, T.P., Klabunde, F, Veit, P., and Hempel, T., Phys. Stat. Sol. 161, 167 (1997).Google Scholar
Itoh, M., Hori, M. and Nadahara, S., J. Vac. Sci. Technol. B9, 149 (1991).Google Scholar
Yamaguchi, T. and Miyagawa, R., Jpn.J. Appl.Phys. 30, 9 A, 2069 (1991).CrossRefGoogle Scholar
Hasoon, F.S, Yan, Y, Althani, H, Jones, K.M, Mountinho, H.R., Alleman, J, Al-Jassim, M.M., and Noufi, R, Thin solid Films 387, 1 (2001).Google Scholar
Ramanathan, K, Contreras, M.A., Perkins, C.L., Asher, S, Hasoon, F.S., Keane, J, Young, D, Romero, M, Metzger, W, Noufi, R, Ward, J, and Duda, A, Prog. Photovolt.: Res. Appl. 11, 255 (2003).Google Scholar
Green, M.A, Emery, K, Hishikawa, Y, Warta, W, and Dunlop, E.D., Prog. Photovolt: Res. Appl. 24, 905–913 (2016).CrossRefGoogle Scholar
Brewer, L, Lamoreux, R.H., Ferro, R, Marazza, R, and Girgis, K, “Molybdenum: Physico-chemical Properties of its Compounds and Alloys”, (International Atomic Agency, Vienna, 1980).Google Scholar
Wada, T, 11th Int. Conf. on Ternary and Multinary compounds, 8, 903 (1997).Google Scholar
Basol, B.M., Kapur, V. K., Leidholm, C.R., Minnick, A., and Halani, A., 1st World Conf. on Photovolt. Energy Conv. IEEE, New York, 149-151 (1994).Google Scholar
Al-Thani, H.A., Hasoon, F.S., Young, M., Asher, S, Alleman, J.L., and Al-Jassim, M.M. and Williamson, D.L., 29th IEEE PVSC, 720-723 (2002).Google Scholar
Al-thani, H.A., Abdullah, M.M., Hasoon, F.S., 37th IEEE PVSC, 315-319 (2011).Google Scholar
PeakFit V4.11: Peak Separation and Analysis Software, Manufactured by SYSTAT Software Inc. Available at http://www.systatsoftware.com (accessed 22nd March 2017).Google Scholar
Cullity, B.D. and Stock, S.R., “Elements of X-Ray Diffraction”, 3rd ed. (Prentice Hall, NY, 2001).Google Scholar
Mathematica V4.2 software, Manufactured by Wolfram Research Inc. Available at http://www.wolfram.com (accessed 22nd March 2017).Google Scholar
Moujoud, M, Kons, P, Jardinier-Offergeld, M, and Bouillon, F, Thin Solid Films 238, 62–69 (1994).CrossRefGoogle Scholar
Kacim, S, Delcambe, P, Binst, L, Jardinier-Offergeld, M, and Bouillon, F, Thin Solid Films 249, 150–154 (1994).CrossRefGoogle Scholar
Kaneko, H, Hasunuma, M, Sawabe, A, Kawanoue, T, Kohanawa, Y, Komatsu, S., and Miyauchi, M, 28th IEEE IRPS, 194-199 (1990).Google Scholar
Boehnke, U.-C. and Kühn, G, J. Mat. Science 22, 1635–1641 (1987).Google Scholar
Nishiwaki, S, Satoh, T, Hayashi, S, Hashimoto, Y, Negami, T, and Wada, T, J. Mater. Res. 14, 4514–4520 (1999).CrossRefGoogle Scholar