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Revisiting the Rius’ Standardless Method for the Quantitative X-Ray Diffraction Analysis of Mixtures of Inorganic Crystalline Phases

Published online by Cambridge University Press:  18 October 2019

J. López-Cuevas Open the ORCID record for J. López-Cuevas [Opens in a new window] ,
J.C. Rendón-Angeles ,
J.L. Rodríguez-Galicia  and
C.A. Gutiérrez-Chavarría
J. López-Cuevas*
Affiliation:
Cinvestav Unidad Saltillo, Calle Industria Metalúrgica No. 1062, Parque Industrial Saltillo - Ramos Arizpe, 25900, Ramos Arizpe, Coahuila, México
J.C. Rendón-Angeles
Affiliation:
Cinvestav Unidad Saltillo, Calle Industria Metalúrgica No. 1062, Parque Industrial Saltillo - Ramos Arizpe, 25900, Ramos Arizpe, Coahuila, México
J.L. Rodríguez-Galicia
Affiliation:
Cinvestav Unidad Saltillo, Calle Industria Metalúrgica No. 1062, Parque Industrial Saltillo - Ramos Arizpe, 25900, Ramos Arizpe, Coahuila, México
C.A. Gutiérrez-Chavarría
Affiliation:
Cinvestav Unidad Saltillo, Calle Industria Metalúrgica No. 1062, Parque Industrial Saltillo - Ramos Arizpe, 25900, Ramos Arizpe, Coahuila, México
*
*Corresponding author: J. López-Cuevas ([email protected])
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Abstract

An alternative method for the standardless quantitative x-ray diffraction analysis of mixtures of inorganic crystalline phases proposed in the literature several years ago is presented. Our method requires only previously calculated μ*i values from tabulated data for all phases present in the mixtures. It does not require either the determination of calibration constants or the use of external standards, but it does require that the number of analyzed mixtures is larger than or equal to the number of phases present in them, and that the chemical composition of the mixtures are significantly different from each other. The integrated intensities of the chemically pure phases are estimated by a least-squares procedure from XRD data obtained from the mixtures. The method was tested against data published in the literature, with good results. Finally, a general expression for the “Normalized Height Law” proposed on an empirical basis by other researchers, has been theoretically derived.

Keywords

x-ray diffraction (XRD)chemical composition
Type
Articles
Information
MRS Advances , Volume 4 , Issue 57-58: International Materials Research Congress XXVIII , 2019 , pp. 3163 - 3169
Copyright
Copyright © Materials Research Society 2019 

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References

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