Hostname: page-component-848d4c4894-2xdlg Total loading time: 0 Render date: 2024-07-07T14:18:08.570Z Has data issue: false hasContentIssue false

Polarization-Induced Transport: A Comparative Study of Ferroelectric and Non-Ferroelectric Dielectric-Gated Organic Field-Effect Transistors

Published online by Cambridge University Press:  02 May 2017

Amrit Laudari
Affiliation:
Department of Physics and Astronomy, University of Missouri, Columbia, MO 65211
Shubhra Gangopadhyay
Affiliation:
Department of Electrical and Computer Engineering, University of Missouri, Columbia, MO 65211
Suchismita Guha*
Affiliation:
Department of Physics and Astronomy, University of Missouri, Columbia, MO 65211
*
Get access

Abstract

A comparative study of ferroelectric and non-ferroelectric-gated organic field-effect transistors (FETs) have been carried out by using a small molecule semiconductor 6,13 bis(triisopropylsilylethynyl) pentacene (TIPS-pentacene) to understand the fundamental aspects of carrier transport in FET architectures. Temperature-dependent current-voltage characteristics from non-ferroelectric dielectric-gated FETs show a clear activated transport, independent of the dielectric constant. While using the ferroelectric dielectric polymer poly(vinylidene fluoride-trifluoroethylene) (PVDF-TrFE), where the dielectric constant may be tuned by changing the temperature, a negative temperature coefficient of the carrier mobility is observed beyond 200 K. The polarization fluctuation dominant transport inherent to a ferroelectric dielectric in conjunction with the discrete nature of traps in TIPS-pentacene results in an effective de-trapping of the shallow trap states into more mobile states.

Type
Articles
Copyright
Copyright © Materials Research Society 2017 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Schott, S., Gann, E., Thomsen, L., Jung, S.-H., Lee, J.-K., McNeill, C. R., and Sirringhaus, H., Adv. Mater. 27, 7356 (2015).Google Scholar
Senanayak, S. P., Ashar, A. Z., Kanimozhi, C., Patil, S., and Narayan, K. S., Phys. Rev. B 91, 115302 (2015).Google Scholar
Senanayak, S. P., Guha, S., and Narayan, K. S., Phys. Rev. B 85, 115311 (2012).Google Scholar
Laudari, A. and Guha, S., J. Appl. Phys. 117, 105501 (2015).Google Scholar
Zheng, H., Mahajan, B. K., Su, S. C., Mukherjee, S., Gangopadhyay, K., and Gangopadhyay, S., Sci. Rep. 6, 25234 (2016).CrossRefGoogle Scholar
Laudari, A. and Guha, S., Phys. Rev. Appl. 6, 044007 (2016).Google Scholar
Gooden, K., Laudari, A., Knotts, G., and Guha, S., Flex. Print. Electron. 1, 015004 (2016).Google Scholar
Knotts, G., Bhaumik, A., Ghosh, K., and Guha, S., Appl. Phys. Lett. 104, 233301 (2014).CrossRefGoogle Scholar