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Buchholz, Tim-Oliver Krull, Alexander Shahidi, Réza Pigino, Gaia Jékely, Gáspár and Jug, Florian 2019. Three-Dimensional Electron Microscopy. Vol. 152, Issue. , p. 277.
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Ju, Yiwei Li, Shuai Yuan, Xiaofei Cui, Lei Godfrey, Andy Yan, Yunjie Cheng, Zhiying Zhong, Xiaoyan and Zhu, Jing 2021. A macro-nano-atomic–scale high-throughput approach for material research. Science Advances, Vol. 7, Issue. 49,
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Bunday, Benjamin and Orji, George 2021. Metrology. p. 01.
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Gianola, Daniel S. della Ventura, Nicolò Maria Balbus, Glenn H. Ziemke, Patrick Echlin, McLean P. and Begley, Matthew R. 2023. Advances and opportunities in high-throughput small-scale mechanical testing. Current Opinion in Solid State and Materials Science, Vol. 27, Issue. 4, p. 101090.
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Haas, Jonas Rieger, Nils Schlegel, Michael Strobel, Kevin and Meyer, Jannik C. 2024. Nanometer-scale electron beam shaping with thickness controlled and stacked nanostructured graphite. Applied Physics Letters, Vol. 124, Issue. 23,
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Multi-beam SEM Technology for High Throughput Imaging
  • Volume 1, Issue 26
  • Kyle Crosby (a1), Anna Lena Eberle (a2) and Dirk Zeidler (a2)
  • DOI: https://doi.org/10.1557/adv.2016.363
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Multi-beam SEM Technology for High Throughput Imaging
  • Volume 1, Issue 26
  • Kyle Crosby (a1), Anna Lena Eberle (a2) and Dirk Zeidler (a2)
  • DOI: https://doi.org/10.1557/adv.2016.363
Available formats Please select a format to save.
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Multi-beam SEM Technology for High Throughput Imaging
  • Volume 1, Issue 26
  • Kyle Crosby (a1), Anna Lena Eberle (a2) and Dirk Zeidler (a2)
  • DOI: https://doi.org/10.1557/adv.2016.363
Available formats Please select a format to save.
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