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Fabrication of Si1-xGex layer on Si substrate by Screen-Printing

Published online by Cambridge University Press:  01 February 2019

Masahiro Nakahara*
Affiliation:
Toyo Aluminium K.K., 341-14 Higashiyama, Ohtani, Hino-Cho, Gamo-Gun, Shiga529-1608, Japan Graduate School of Engineering, Nagoya University, Furocho, Chikusa-ku, 464-8603, Nagoya, Japan
Moeko Matsubara
Affiliation:
Toyo Aluminium K.K., 341-14 Higashiyama, Ohtani, Hino-Cho, Gamo-Gun, Shiga529-1608, Japan
Shota Suzuki
Affiliation:
Toyo Aluminium K.K., 341-14 Higashiyama, Ohtani, Hino-Cho, Gamo-Gun, Shiga529-1608, Japan
Shogo Fukami
Affiliation:
Graduate School of Engineering, Nagoya University, Furocho, Chikusa-ku, 464-8603, Nagoya, Japan
Marwan Dhamrin
Affiliation:
Toyo Aluminium K.K., 341-14 Higashiyama, Ohtani, Hino-Cho, Gamo-Gun, Shiga529-1608, Japan
Noritaka Usami
Affiliation:
Graduate School of Engineering, Nagoya University, Furocho, Chikusa-ku, 464-8603, Nagoya, Japan
*
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Abstract

The impact of the Al and Ge ratio in the Al-Ge pastes are investigated for fabricating the single crystalline Si1-xGex thick layers on large area Si substrates by screen-printing metallization process. From X-ray reciprocal space maps, Ge fraction in the fabricated Si1-xGex thick layers are found to increase up to 40% with increasing the Ge ratio in the Al-Ge pastes. On the other hand, the interface of the Si and Si1-xGex layers are getting winding with increasing the Ge ratio in the Al-Ge pastes. The Al-Si-Ge phase diagram indicated that uniform SiGe layer can be fabricated by adjusting the Al-Ge ratio in the pastes within the liquid phase region.

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Articles
Copyright
Copyright © Materials Research Society 2019 

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References

REFERENCES

Shockley, William and Queisser, Hans J., Journal of Applied Physics, volume 32,pp. 510-519 (1961).CrossRefGoogle Scholar
Green, M.A., Hishikawa, Yoshiro, Dunlop, Ewan D., Levi, Dean H., Hohl-Ebinger, Jochen and Ho-Baillie, Anita W.Y., “Solar cell efficiency tables (version 51)”, Progress in Photovoltaics: Res. Appl. 26, 3-12 (2017).CrossRefGoogle Scholar
Abdul Hadi, Sabina, Fitzgerald, Eugene A., Griffiths, Steven, and Nayfeh, Ammar, Journal of Renewable and Sustainable Energy 10, 015905 (2018).CrossRefGoogle Scholar
Bolkhovityanov, Yu B, Pchelyakov, O.P., Physics-Uspekhi. 51 5, 437-456 (2008).CrossRefGoogle Scholar
Dhamrin, M., Suzuki, S., Kikuchi, K., Nakahara, M. and Morishita, N., Patent (WO2017051775A1)Google Scholar
Dhamrin, M., presented at PVSEC-26 in Singapore (2016)Google Scholar
Ohmiya, M., Ohsasa, K., Ohmi, T. and Kudoh, M., Bulletin of the Facility of Engineering Hokkaido University No.156 (1991),Google Scholar