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Atomistic Study of Deformation and Failure Behavior in Nanocrystalline Mg

Published online by Cambridge University Press:  11 April 2016

Garvit Agarwal
Affiliation:
Department of Materials Science and Engineering, and Institute of Materials Science, University of Connecticut, Storrs, CT, United States
Gabriel Paun
Affiliation:
Department of Materials Science and Engineering, and Institute of Materials Science, University of Connecticut, Storrs, CT, United States
Ramakrishna R. Valisetty
Affiliation:
Computational and Information Sciences Directorate, US Army Research Laboratory, Aberdeen Proving Ground, MD, United States
Raju Namburu
Affiliation:
Computational and Information Sciences Directorate, US Army Research Laboratory, Aberdeen Proving Ground, MD, United States
Arunachalam M. Rajendran
Affiliation:
Department of Mechanical Engineering, University of Mississippi, University, MS, United States
Avinash M. Dongare*
Affiliation:
Department of Materials Science and Engineering, and Institute of Materials Science, University of Connecticut, Storrs, CT, United States
*
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Abstract

Large scale molecular dynamics (MD) simulations are carried out to investigate the failure response of nanocrystalline Mg using the EAM potential under conditions of uniaxial tensile stress and uniaxial tensile strain loading. The MD simulations are carried out at a strain rate of 109s-1 for grain sizes in the range of 10 nm to 30 nm. The effect of grain size on the strength of the metal is investigated and the critical grain size for transition to inverse Hall-Petch regime is identified.

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Articles
Copyright
Copyright © Materials Research Society 2016 

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References

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