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Transmission electron microscopy (TEM) of Earth and planetary materials: A review

Published online by Cambridge University Press:  05 July 2018

M. R. Lee
M. R. Lee*
Affiliation:
Department of Geographical and Earth Sciences, University of Glasgow, Gregory Building, Glasgow G12 8QQ, UK
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Abstract

Using high intensity beams of fast electrons, the transmission electron microscope (TEM) and scanning transmission electron microscope (STEM) enable comprehensive characterization of rocks and minerals at micrometre to sub-nanometre scales. This review outlines the ways in which samples of Earth and planetary materials can be rendered sufficiently thin for TEM and STEM work, and highlights the significant advances in site-specific preparation enabled by the focused ion beam (FIB) technique. Descriptions of the various modes of TEM and STEM imaging, electron diffraction and X-ray and electron spectroscopy are outlined, with an emphasis on new technologies that are of particular relevance to geoscientists. These include atomic-resolution Z-contrast imaging by high-angle annular dark-field STEM, electron crystallography by precession electron diffraction, spectrum mapping using X-rays and electrons, chemical imaging by energy-filtered TEM and true atomic-resolution imaging with the new generation of aberration-corrected microscopes. Despite the sophistication of modern instruments, the spatial resolution of imaging, diffraction and X-ray and electron spectroscopy work on many natural materials is likely to remain limited by structural and chemical damage to the thin samples during TEM and STEM.

Keywords

transmission electron microscopyelectron diffractionelectron energy loss spectroscopyfocused ion beam
Type
Review
Information
Mineralogical Magazine , Volume 74 , Issue 1 , February 2010 , pp. 1 - 27
Copyright
Copyright © The Mineralogical Society of Great Britain and Ireland 2010

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