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A HRTEM study of defects in silver-doped galena

Published online by Cambridge University Press:  05 July 2018

A. Pring  and
T. B. Williams
A. Pring
Affiliation:
Department of Mineralogy, South Australian Museum, North Terrace, Adelaide, South Australia 5000, Australia
T. B. Williams
Affiliation:
C.S.I.R.O. Division of Materials Science and Technology, Locked Bag 33, Clayton, Victoria 3168, Australia
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Abstract

Synthetic Ag-doped PbS samples were Ar ion beam milled and examined by HRTEM. The silver was found to aggregate in inclusions which have no crystallographic relationship to the PbS host, rather than forming crystallographic defects. The Ag2S inclusions are 500 Å in diameter or larger. The limit of Ag substitution into PbS in solid solution in the absence of Bi or Sb is less than 0.1 mol %. The ion beam milling process introduced a large number of small dislocations in both Ag-doped and pure PbS specimens. These dislocations are thought to be formed through coalescences of point defects.

Keywords

galenasilverHRTEMion beam milling
Type
Mineralogy
Information
Mineralogical Magazine , Volume 58 , Issue 392 , September 1994 , pp. 455 - 459
Copyright
Copyright © The Mineralogical Society of Great Britain and Ireland 1994

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Footnotes

*

Present address JASCO International Co. Ltd., 4-21 Sennin-cho 2-chome, Hachioji City 193, Japan

References

Bloem, J. (1956) Controlled conductivity in lead sulphide single crystals. Philips Research Reports, 11, 273–336.Google Scholar
Bloem, J. and Kroger, F. A. (1956) The P-T-X phase diagram of the lead-sulphur system. Z. physik. Chem., Neue Folge, 7, 1–14.Google Scholar
Boorman, R. S. (1968) Silver in some New Brunswick galenas. New Brunswick Research and Productivity Council, Research Note 11.Google Scholar
Chew, N. G. and Cullis A. G. (1984) Iodine ion milling of indium-containing compound semicon-ductors. App. Phys. Lett., 44, 142–4.Google Scholar
Goodman, P. and Moodie A. F. (1974) Numerical Evaluation of N-beam wave functions in electron scattering by the multi-slice method. Ada Cryst., A30, 280–90.Google Scholar
Pattrick, R. A. D., Dorling, M. and Polya, D. A. (1993) TEM study of indium-and copper-bearing growth-banded sphalerite. Can. Mineral., 31, 105–17.Google Scholar
Scherzer, O. (1949) The theoretical resolution limit of electron microscopes. J. Appl. Phys., 20, 20–29.Google Scholar
Sharp, T. G. and Buseck P. R. (1993) The distribution of Ag and Sb in galena: Inclusions versus solid solution. Amer. Mineral., 78, 85–95.Google Scholar
van Hook, H. J. (1960) The ternary system Ag2S-Bi2S3-PbS. Econ. Geol, 55, 759–88.Google Scholar
Zheng, N. J., Wilson, I. H., Knipping, U., Burt, D. M., Krinsley, D. H. and Tsong, I. S. T. (1988) Atomically resolved scanning tunnelling micro-scopy images of dislocations. Phys. Rev., B38, 12780–82.Google Scholar