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An X-ray method for studying orientation of micaceous minerals in shales, clays, and similar materials

Published online by Cambridge University Press:  14 March 2018

G. W. Brindley
G. W. Brindley*
Affiliation:
Physics Department, University of Leeds
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Extract

Micaceous minerals, such as the micas, the chlorites, and most clay minerals, usually develop as thin lamellae parallel to the crystallographic basal plane (001). In sedimentary deposits these lamellae tend to lie parallel to the bedding plane and in slates parallel to the cleavage. Their degree of orientation is likely to vary with the conditions of formation of the material, and in the case of slates Bates (1947) has shown that it is closely related to their fissility. In relatively coarse-grained materials the degree of orientation may be studied directly by suitable microscopic techniques, but with fine-grained materials X-ray methods must be used, and even with coarser-grained materials the use of X-ray methods may have advantages, especially if a scanning technique, such as that described by Thewlis and Pollock (1950), is employed.

Type
Research Article
Information
Mineralogical magazine and journal of the Mineralogical Society , Volume 30 , Issue 220 , March 1953 , pp. 71 - 78
Copyright
Copyright © The Mineralogical Society of Great Britain and Ireland 1953

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References

Bates, (T. F.), 1947. Investigation of the micaceous minerals in slate. Amer. Min., vol. 32, pp. 625–636. [M.A. 10-365.]Google Scholar
Brentano, (J. [C. M]), 1927. Intensity measurements of X-ray reflections from fine powders. Phil. Mag., ser. 7, vol. 4, pp. 620–629.Google Scholar
Brentano, (J. C. M.), 1935. The quantitative measurement of the intensity of X-ray reflections from crystalline powders. Proc. Physical Soc., vol. 47, pp. 932–947.Google Scholar
Brindley, (G. W.) and Spiers, (F. W.), 1934. A technique for the photographic determination of the intensities of X-ray reflections from powders. Proc. Physical Soc., vol. 46, pp. 841–852.Google Scholar
Custers, (J. F. H.), 1948a. A new method for the determination of preferred orientations. Physica, vol. 14, pp. 453–460.Google Scholar
Custers, (J. F. H.) 1948b. The intensity distribution along the Debye halo of a flat specimen in connection with a new method for the determination of preferred orientations. Physica, vol. 14, pp. 461–474.Google Scholar
Macewan, (D. M. C.) and Norrish, (K.), 1951. Second International Congress of Crystallography, Stockholm, Abstract no. A1.Google Scholar
Theswlis, (J.) and Pollock, (A. R.), 1950. X-ray scanning camera. Journ. Sci. Instruments, vol. 27, pp. 72–73.Google Scholar