Microscopy and Microanalysis: Volume 28 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 28 - April 2022

Physical Sciences Symposia

Advanced Imaging and Spectroscopy for Nanoscale Materials

Emergent Interfacial Magnetism in Superconducting Cuprate-Manganate Superlattices

Cryogenic Electron Microscopy on Strongly Correlated Quantum Materials

Combining STEM Imaging and X-Ray Diffraction for Structure Determination of a New Highly Distorted Infinite-Layer Phase

The Advanced Characterization and Structure-Property Correlation of BaMnO3 for the Oxygen Reduction Reaction Using Electron Microscopy

Atomic Scale Crystal Field Mapping of Polar Vortices in Oxide Superlattices

Tunable Microstructures in Entropy-Stabilized Oxide Thin Films Studied with Unsupervised Machine Learning Assisted Electron Microscopy

Application of 4D STEM and DPC Techniques to Study Surface Reconstruction of Transition Aluminas

Effect of Ca Doping on the Microstructure and Mechanical Properties of Magnesium Aluminate Spinel

Crystal Surfaces and Their Role on Electrochemical Activity in MgV2O4 Crystals

Imaging Structural Defects and Associated Oxygen Positions in Li-rich Li1.2Ni0.13Mn0.54Co0.13O2

4D-STEM Mapping of Nanoscale Structural Ordering in Cathode Materials

Correlating Surface Strain with Activity in Commercial Platinum Catalysts

Mapping Local Structure, Electronic and Excitonic Properties at the 2D/3D Interface

Tracking Degradation in Individual Catalyst Nanoparticles Under Fuel Cell-Relevant Cycling Conditions by Identical-Location STEM

Determination of the Thermal Expansion Coefficient and the Local temperature Measurements of BaTiO3 Nanoparticles with Nanometer Resolution

Measuring 3D Chemistry with Fused Multi-Modal Electron Tomography

Correlated AFM/STEM Study on the Mechanical Stiffness of Defect-Engineered Graphene

Large-Aperture STEM Hexapole Cs-Corrector

Exploiting the Full Potential of the Advanced Two-hexapole Corrector for STEM

The User Adjustable Pole-piece: Expanding TEM Functionality Without Compromise

Microscopy and Microanalysis

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Volume 28 - April 2022

Physical Sciences Symposia

Advanced Imaging and Spectroscopy for Nanoscale Materials