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Large-Aperture STEM Hexapole Cs-Corrector

Published online by Cambridge University Press:  22 July 2022

S. Uhlemann ,
T. Riedel ,
P. Hartel ,
S. Perl ,
M. Linck ,
V. Gerheim  and
H. Müller
S. Uhlemann*
Affiliation:
Corrected Electron Optical Systems GmbH, Englerstr. 28, D-69126 Heidelberg, Germany
T. Riedel
Affiliation:
Corrected Electron Optical Systems GmbH, Englerstr. 28, D-69126 Heidelberg, Germany
P. Hartel
Affiliation:
Corrected Electron Optical Systems GmbH, Englerstr. 28, D-69126 Heidelberg, Germany
S. Perl
Affiliation:
Corrected Electron Optical Systems GmbH, Englerstr. 28, D-69126 Heidelberg, Germany
M. Linck
Affiliation:
Corrected Electron Optical Systems GmbH, Englerstr. 28, D-69126 Heidelberg, Germany
V. Gerheim
Affiliation:
Corrected Electron Optical Systems GmbH, Englerstr. 28, D-69126 Heidelberg, Germany
H. Müller
Affiliation:
Corrected Electron Optical Systems GmbH, Englerstr. 28, D-69126 Heidelberg, Germany
*
*Corresponding author: [email protected]

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2630 - 2632
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Copyright
Copyright © Microscopy Society of America 2022

References

Müller, H. et al. , Microsc. Microanal. 12 (2006) 442-455.CrossRefGoogle Scholar
Sawada, H. et al. , J. Electron Microsc. 58 (2009) 341-347.CrossRefGoogle Scholar
Bischoff, M. et al. , Microsc. Microanal. 24 (2018) 1134-1135.CrossRefGoogle Scholar
Morishita, S. et al. , Microscopy 67 (2018) 156-163.CrossRefGoogle Scholar
Watanabe, M. et al. , Microsc. Microanal. 22 (2016) 310-311.CrossRefGoogle Scholar
Hartel, P. et al. , Ultramicroscopy 206 (2019) 112821.CrossRefGoogle Scholar
Intaraprasonk, V. et al. , Ultramicroscopy 108 (2008) 1454-1466.CrossRefGoogle Scholar
Morishita, S. et al. , Phys.Rev.Let. 117 (2016) 153004.CrossRefGoogle Scholar
Ishikawa, R. et al. , Ultramicroscopy 151 (2015) 122-129.CrossRefGoogle Scholar
Sagawa, R. et al. , Ultramicroscopy 233 (2022) 113440.CrossRefGoogle Scholar
We acknowledge and highly appreciate the collaboration and support by JEOL company.Google Scholar