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Combining STEM Imaging and X-Ray Diffraction for Structure Determination of a New Highly Distorted Infinite-Layer Phase
Published online by Cambridge University Press: 22 July 2022
Abstract
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- Type
- Advanced Imaging and Spectroscopy for Nanoscale Materials
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- Copyright
- Copyright © Microscopy Society of America 2022
References
This work was supported by DOD AFOSR (FA 9550-16-1-0305) and NSF (DMR-1719875, DGE-1650441).Google Scholar
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