Hostname: page-component-cd9895bd7-jkksz Total loading time: 0 Render date: 2024-12-24T13:54:25.522Z Has data issue: false hasContentIssue false
  • English
  • Français

Cryogenic Electron Microscopy Combined with Energy-Dispersive X-ray Spectroscopy Tomography for Materials Science

Published online by Cambridge University Press:  22 July 2022

Lin Jiang ,
Yang He ,
Chongmin Wang ,
Cedric Bouchet-Marquis ,
Lee Pullan ,
Brandon Van Leer ,
Liu Zhao ,
Yuri Rikers ,
Christian Maunders  and
David Foord
...Show all authors
Lin Jiang*
Affiliation:
Materials & Structural Analysis Division, Thermo Fisher Scientific, Hillsboro, OR, USA
Yang He*
Affiliation:
Beijing Advanced Innovation Center for Materials Genome Engineering, School of Materials Science and Engineering, University of Science and Technology Beijing, Beijing, China
Chongmin Wang
Affiliation:
Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory, Richland, WA, USA
Cedric Bouchet-Marquis
Affiliation:
Materials & Structural Analysis Division, Thermo Fisher Scientific, Hillsboro, OR, USA
Lee Pullan
Affiliation:
Materials & Structural Analysis Division, Thermo Fisher Scientific, Hillsboro, OR, USA
Brandon Van Leer
Affiliation:
Materials & Structural Analysis Division, Thermo Fisher Scientific, Hillsboro, OR, USA
Liu Zhao
Affiliation:
Materials & Structural Analysis Division, Thermo Fisher Scientific, Hillsboro, OR, USA
Yuri Rikers
Affiliation:
Materials & Structural Analysis Division, Thermo Fisher Scientific, Hillsboro, OR, USA
Christian Maunders
Affiliation:
Materials & Structural Analysis Division, Thermo Fisher Scientific, Hillsboro, OR, USA
David Foord
Affiliation:
Materials & Structural Analysis Division, Thermo Fisher Scientific, Hillsboro, OR, USA
Richard G. White
Affiliation:
Materials & Structural Analysis Division, Thermo Fisher Scientific, Hillsboro, OR, USA
*
*Corresponding author: [email protected]; [email protected]
*Corresponding author: [email protected]; [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
On Demand - Advanced 3D Imaging and Analysis Methods for New Opportunities in Material Science
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 328 - 330
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

Footnotes

‡

Previously working at Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory, Richland, WA

References

Li, Y, Huang, W., Li, Y, Chiu, W, Cui, Y, Opportunities for Cryogenic Electron Microscopy in Materials Science and Nanoscience. ACS Nano 14 (2020), p. 9263. doi:10.1021/acsnano.0c05020.CrossRefGoogle ScholarPubMed
Wang, X, Li, Y and Meng, Y S, Cryogenic Electron Microscopy for Characterizing and Diagnosing Batteries. Joule 2 (2018), p. 1. doi:10.1016/j.joule.2018.10.005.CrossRefGoogle Scholar
He, Y., Jiang, L., Jia, H., Yi, R., Xu, Y., Genc, A., Bouchet-Marquis, C., Warran, R., Pullan, L., Tessner, T., Yoo, J., Li, X., Zhang, J.G., Wang, C.M.. Progressive growth of the solid–electrolyte interphase towards the Si anode interior causes capacity fading. Nature Nanotechnology 16 (2021), p. 1113. doi:10.1038/s41565-021-00947-8.CrossRefGoogle Scholar
The authors acknowledge funding from the Assistant Secretary for Energy Efficiency and Renewable Energy, Office of Vehicle Technologies of the US Department of Energy.Google Scholar