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Dose-Efficient Defect Contrast with 4D-STEM

Published online by Cambridge University Press:  22 July 2022

Stephanie M. Ribet ,
Colin Ophus ,
Roberto dos Reis  and
Vinayak P. Dravid
Stephanie M. Ribet
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, IL, USA International Institute of Nanotechnology, Northwestern University, Evanston, IL, USA
Colin Ophus
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Lab, Berkeley, CA, USA
Roberto dos Reis
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, IL, USA International Institute of Nanotechnology, Northwestern University, Evanston, IL, USA The NUANCE Center, Northwestern University, Evanston, IL, USA
Vinayak P. Dravid*
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, IL, USA International Institute of Nanotechnology, Northwestern University, Evanston, IL, USA The NUANCE Center, Northwestern University, Evanston, IL, USA
*
*Corresponding author: [email protected]

Abstract

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Type
Developments of 4D-STEM Imaging - Enabling New Materials Applications
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 346 - 348
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Copyright
Copyright © Microscopy Society of America 2022

References

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This work made use of the EPIC facility of Northwestern University's NUANCE Center, which has received support from the SHyNE Resource (NSF ECCS-2025633), the IIN, and Northwestern's MRSEC program (NSF DMR-1720139). This research was supported in part through the computational resources and staff contributions provided for the Quest high performance computing facility at Northwestern University which is jointly supported by the Office of the Provost, the Office for Research, and Northwestern University Information Technology. SMR acknowledges support from the International Institute of Technology, 3M, the American Membrane Technology Association, and the National Water Research Institute.Google Scholar