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Addressing Thickness Induced Contrast Reversals in Focused Probe Ptychography

Published online by Cambridge University Press:  22 July 2022

Chuang Gao ,
Christoph Hofer  and
Timothy J. Pennycook
Chuang Gao
Affiliation:
Electron Microscopy for Materials Science (EMAT), University of Antwerp, Antwerp, Belgium
Christoph Hofer
Affiliation:
Electron Microscopy for Materials Science (EMAT), University of Antwerp, Antwerp, Belgium
Timothy J. Pennycook*
Affiliation:
Electron Microscopy for Materials Science (EMAT), University of Antwerp, Antwerp, Belgium
*
*Corresponding author: [email protected]

Abstract

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Type
Developments of 4D-STEM Imaging - Enabling New Materials Applications
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 360 - 361
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Copyright
Copyright © Microscopy Society of America 2022

References

Findlay, S. D. et al. , Applied Physics Letters, 95 (2009), p. 191913.CrossRefGoogle Scholar
Lazić, I. et al. , Ultramicroscopy 160 (2016), p. 265-280.CrossRefGoogle Scholar
Jannis, D. et al. , Ultramicroscopy 233 (2022), p. 113434.CrossRefGoogle Scholar
Pennycook, T. J. et al. , Ultramicroscopy 151 (2015), p. 160-167.CrossRefGoogle Scholar
Hao, Y. et al. , Nat. Commun. 7 (2016), p. 12532.Google Scholar
Hao, Y. et al. , Ultramicroscopy 180 (2017), p. 173-179.Google Scholar
Pennycook, T. J. et al. , Ultramicroscopy 196 (2019), p. 131–135.CrossRefGoogle Scholar
Research funded by European Research Council Grant no. 802123-HDEM.Google Scholar