INSTRUMENTATION & METHODS
New Instruments
Abstract
Installation of Lau Interferometer into X-Ray Microscope system for Phase-CT Measurement
-
- Published online by Cambridge University Press:
- 10 August 2018, pp. 188-189
-
- Article
-
- You have access
- Export citation
Analytical and Instrumentation Science Symposia
Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond
Abstract
Thick (3D) Sample Imaging Using iDPC-STEM at Atomic Scale
-
- Published online by Cambridge University Press:
- 01 August 2018, pp. 170-171
-
- Article
-
- You have access
- Export citation
INSTRUMENTATION & METHODS
New Instruments
Abstract
Development of Laboratory Grating-based X-ray Phase Contrast Microtomography for Improved Pathology
-
- Published online by Cambridge University Press:
- 10 August 2018, pp. 190-191
-
- Article
-
- You have access
- Export citation
Analytical and Instrumentation Science Symposia
Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond
Abstract
Scanning Convergent Beam Electron Diffraction (CBED), the Essential Questions of Why, What and How?
-
- Published online by Cambridge University Press:
- 01 August 2018, pp. 172-173
-
- Article
-
- You have access
- Export citation
INSTRUMENTATION & METHODS
New Instruments
Abstract
Design Concept for the In Situ Nanoprobe Beamline for the APS Upgrade
-
- Published online by Cambridge University Press:
- 10 August 2018, pp. 192-193
-
- Article
-
- You have access
- Export citation
Imaging Capabilities, Performance and Applications of the Hard X-ray Nanoprobe Beamline at NSLS-II
-
- Published online by Cambridge University Press:
- 10 August 2018, pp. 194-195
-
- Article
-
- You have access
- Export citation
Analytical and Instrumentation Science Symposia
Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond
Abstract
Tuning STEM: Tailoring the Incident Probe, Scattering Dynamics and Detector Geometry for Maximum Specimen Information
-
- Published online by Cambridge University Press:
- 01 August 2018, pp. 174-175
-
- Article
-
- You have access
- Export citation
Mapping Polarity, Toroidal Order, and the Local Energy Landscape by 4D-STEM
-
- Published online by Cambridge University Press:
- 01 August 2018, pp. 176-177
-
- Article
-
- You have access
- Export citation
INSTRUMENTATION & METHODS
New Instruments
Abstract
Lab-based Nanoscale 3D X-Ray Microscopy for Failure Analysis on Advanced Semiconductors
-
- Published online by Cambridge University Press:
- 10 August 2018, pp. 196-197
-
- Article
-
- You have access
- Export citation
Analytical and Instrumentation Science Symposia
Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond
Abstract
Three-Dimensional Polarization by Means of Scanning HOLZ-CBED Technique
-
- Published online by Cambridge University Press:
- 01 August 2018, pp. 178-179
-
- Article
-
- You have access
- Export citation
INSTRUMENTATION & METHODS
New Instruments
Abstract
Developing the XEOL and TR-XEOL at the X-ray Nanoprobe at Taiwan Photon Source
-
- Published online by Cambridge University Press:
- 10 August 2018, pp. 198-199
-
- Article
-
- You have access
- Export citation
A Scanning Transmission X-Ray Microscope at the PLS: New Detection Modes
-
- Published online by Cambridge University Press:
- 10 August 2018, pp. 200-201
-
- Article
-
- You have access
- Export citation
Analytical and Instrumentation Science Symposia
Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond
Abstract
Imaging Structure and Magnetisation in New Ways Using 4D STEM
-
- Published online by Cambridge University Press:
- 01 August 2018, pp. 180-181
-
- Article
-
- You have access
- Export citation
INSTRUMENTATION & METHODS
New Instruments
Abstract
First Results from the X-Ray Microscopy Beamline U41-PGM1-XM at BESSY II.
-
- Published online by Cambridge University Press:
- 10 August 2018, pp. 202-203
-
- Article
-
- You have access
- Export citation
Analytical and Instrumentation Science Symposia
Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond
Abstract
Scanning Electron Diffraction – Crystal Mapping at the Nanoscale
-
- Published online by Cambridge University Press:
- 01 August 2018, pp. 182-183
-
- Article
-
- You have access
- Export citation
Insights into Texture and Phase Coexistence in Polycrystalline and Polyphasic Ferroelectric HfO2 Thin Films using 4D-STEM
-
- Published online by Cambridge University Press:
- 01 August 2018, pp. 184-185
-
- Article
-
- You have access
- Export citation
INSTRUMENTATION & METHODS
New Instruments
Abstract
The New HZB X-Ray Microscopy Beamline U41-PGM1-XM at BESSY II.
-
- Published online by Cambridge University Press:
- 10 August 2018, pp. 204-205
-
- Article
-
- You have access
- Export citation
Analytical and Instrumentation Science Symposia
Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond
Abstract
Low Dose Defocused Probe Electron Ptychography Using a Fast Direct Electron Detector
-
- Published online by Cambridge University Press:
- 01 August 2018, pp. 186-187
-
- Article
-
- You have access
- Export citation
INSTRUMENTATION & METHODS
New Instruments
Abstract
3D Full-field Transmission X-ray Microscopy Based on Equally Sloped Tomography at Shanghai Synchrotron Radiation Facility
-
- Published online by Cambridge University Press:
- 10 August 2018, pp. 206-207
-
- Article
-
- You have access
- Export citation
Analytical and Instrumentation Science Symposia
Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond
Abstract
Sample Thickness Limitations in Defocused Electron Probe Ptychography
-
- Published online by Cambridge University Press:
- 01 August 2018, pp. 188-189
-
- Article
-
- You have access
- Export citation