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Volume 24 - August 2018

Contents

Page 11 of 77

Analytical and Instrumentation Science Symposia

Atomic-scale Functional Imaging in Aberration-corrected Electron Microscopy

Abstract

INSTRUMENTATION & METHODS

New Methods

Abstract

Analytical and Instrumentation Science Symposia

Atomic-scale Functional Imaging in Aberration-corrected Electron Microscopy

Abstract

INSTRUMENTATION & METHODS

New Methods

Abstract

  • Pygmi: Guided Microscope Control Interface with Workflow Manager

  • Mirna Lerotic, Ian McNulty, Martin V. Holt
  • Published online by Cambridge University Press:
    10 August 2018, pp. 124-125
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Analytical and Instrumentation Science Symposia

Atomic-scale Functional Imaging in Aberration-corrected Electron Microscopy

Abstract

INSTRUMENTATION & METHODS

New Methods

Abstract

Analytical and Instrumentation Science Symposia

Atomic-scale Functional Imaging in Aberration-corrected Electron Microscopy

Abstract

INSTRUMENTATION & METHODS

New Methods

Abstract

  • Single-shot X-ray Dark-field Imaging

  • Zhili Wang, Dalin Liu, Kun Ren, Xiaomin Shi, Jianlin Xia
  • Published online by Cambridge University Press:
    10 August 2018, pp. 128-129
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Analytical and Instrumentation Science Symposia

Atomic-scale Functional Imaging in Aberration-corrected Electron Microscopy

Abstract

INSTRUMENTATION & METHODS

New Methods

Abstract

  • Improvement of Scanning Procedure for 4D-X-ray Phase Tomography

  • Masato Hoshino, Kentaro Uesugi, Naoto Yagi, Takuro Tsukube
  • Published online by Cambridge University Press:
    10 August 2018, pp. 130-131
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Analytical and Instrumentation Science Symposia

Atomic-scale Functional Imaging in Aberration-corrected Electron Microscopy

Abstract

  • Surface and Electric Field Imaging by Newly Designed Atomic-Resolution STEM

  • Ryo Ishikawa, Naoya Shibata, Yuichi Ikuhara
  • Published online by Cambridge University Press:
    01 August 2018, pp. 118-119
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INSTRUMENTATION & METHODS

New Methods

Abstract

  • Practical X-ray Ghost Imaging

  • Andrew M. Kingston, Glenn R. Myers, Margie P. Olbinado, Alexander Rack, Daniele Pelliccia, David M. Paganin
  • Published online by Cambridge University Press:
    10 August 2018, pp. 132-133
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Analytical and Instrumentation Science Symposia

Atomic-scale Functional Imaging in Aberration-corrected Electron Microscopy

Abstract

INSTRUMENTATION & METHODS

New Methods

Abstract

  • Optimal Design of Experiment for X-Ray Spectromicroscopy by Machine Learning

  • Tetsuro Ueno, Hideitsu Hino, Kanta Ono
  • Published online by Cambridge University Press:
    10 August 2018, pp. 134-135
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Analytical and Instrumentation Science Symposia

Atomic-scale Functional Imaging in Aberration-corrected Electron Microscopy

Abstract

INSTRUMENTATION & METHODS

New Methods

Abstract

  • Simultaneously Iterative Fast Projection Matching (SI-Faproma)

  • Chun-Chieh Wang
  • Published online by Cambridge University Press:
    10 August 2018, pp. 136-137
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Analytical and Instrumentation Science Symposia

Atomic-scale Functional Imaging in Aberration-corrected Electron Microscopy

Abstract

INSTRUMENTATION & METHODS

New Methods

Abstract

  • Locating the 'missing wedge' artifacts from limited-angle CT reconstruction

  • Jianhong Liu, Yong Guan, Liang Chen, Haobo Bai, Wenbin Wei, Yangchao Tian, Gang Liu
  • Published online by Cambridge University Press:
    10 August 2018, pp. 138-139
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  • 'Missing wedge' problem exists in some kind of CT imaging situations, such as electron microscopy, x-ray nano-CT image, etc. Method such as iterative reconstruction algorithms, total variation based method were applied to improve the reconstruction quality, but the 'missing wedge' artifacts are still inevitable. In this paper, a method based on image processing technique was proposed to locate the 'missing wedge' artifacts in CT reconstruction. The result showed good performance on locating the artifacts, which also showed the potential in CT reconstruction and image analysis in nano-CT.

Analytical and Instrumentation Science Symposia

Atomic-scale Functional Imaging in Aberration-corrected Electron Microscopy

Abstract

INSTRUMENTATION & METHODS

New Methods

Abstract

  • The Precise Alignment and Auto-fusion of Correlative Cryo-SXT and Cryo-FM.

  • Haobo Bai, Yong Guan, Liang Chen, Gang Liu, Yangchao Tian
  • Published online by Cambridge University Press:
    10 August 2018, pp. 140-141
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  • Cell's sub-cellular architecture and function can be revealed by Cryo soft X-ray tomography (Cryo-SXT) and Cryo-fluorescence microscopy (Cryo-FM) respectively. To understand the connection between cells' structure and function, correlative Cryo-SXT and Cryo-FM has been applied. Here we introduce a semiautomatic precise alignment and fusion technology of Cryo-SXT and Cryo-fluorescence microscopy.

Page 11 of 77