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Design Concept for the In Situ Nanoprobe Beamline for the APS Upgrade

Published online by Cambridge University Press:  10 August 2018

Jorg Maser ,
Barry Lai ,
Vincent De Andrade ,
Simon R. Bare ,
Mariana Bertoni ,
Tonio Buonassisi ,
Paul Evans ,
David P. Fenning ,
Steve Heald  and
Chris Johnson
...Show all authors
Jorg Maser*
Affiliation:
X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA
Barry Lai
Affiliation:
X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA
Vincent De Andrade
Affiliation:
X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA
Simon R. Bare
Affiliation:
SSRL, SLAC National Accelerator Laboratory, CA, USA.
Mariana Bertoni
Affiliation:
Arizona State University, Tempe, AZ, USA.
Tonio Buonassisi
Affiliation:
Massachusetts Institute of Technology, Cambridge, MA, USA.
Paul Evans
Affiliation:
University of Wisconsin-Madison, WI, USA
David P. Fenning
Affiliation:
University of California, San Diego, USA.
Steve Heald
Affiliation:
X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA
Chris Johnson
Affiliation:
Chemical Sciences and Engineering Division, Argonne, IL, USA.
Tony Lanzirotti
Affiliation:
The University of Chicago, IL, USA.
Conal Murray
Affiliation:
IBM T.J. Watson Research Center, Yorktown Heights, NY, USA.
Tijana Rajh
Affiliation:
Center for Nanoscale Materials, Argonne National Laboratory, Argonne, IL, USA
Volker Rose
Affiliation:
X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA Center for Nanoscale Materials, Argonne National Laboratory, Argonne, IL, USA
Ruben Reininger
Affiliation:
X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA
Xianbo Shi
Affiliation:
X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA
M. Stuckelberger
Affiliation:
Deutsches Elektronen-Synchrotron, Hamburg, Germany
David Tiede
Affiliation:
Chemical Sciences and Engineering Division, Argonne, IL, USA.
Stefan Vogt
Affiliation:
X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA
Randy Winans
Affiliation:
X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA
*
*Corresponding author, [email protected]

Abstract

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Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 192 - 193
Copyright
© Microscopy Society of America 2018 

References

[1] Maser, J., et alMetall. Mater. Trans. DOI: 10.1007/s11661-013-1901-x , (2013).Google Scholar
[2] Mimura, H., Handa, S., Kimura, T., et alNat. Phys. (2010) doi: 10.1038/nphys14.Google Scholar
[3] Shu, D., et alProceedings of 28th ASPE Annual Meeting, (2013).Google Scholar
[4] Stuckelberger, Bertoni M., Nietzold, T., et alJ-PV, (2017), doi: 10.1109/JPHOTOV.2017.2762584.Google Scholar
[5] This research used resources of the Advanced Photon Source, a U.S. Department of Energy (DOE) Office of Science User Facility operated for the DOE Office of Science by Argonne National Laboratory under Contract No. DE-AC02-06CH11357..Google Scholar