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Tuning STEM: Tailoring the Incident Probe, Scattering Dynamics and Detector Geometry for Maximum Specimen Information

Published online by Cambridge University Press:  01 August 2018

J. Etheridge ,
W. Chao ,
E. Drath Bøjesen ,
Y. Guo ,
M. Krajnak ,
W. Li  and
C. L. Zheng
J. Etheridge
Affiliation:
Monash Centre for Electron Microscopy, Monash University, VIC3800, Australia Department of Materials Science and Engineering, Monash University, VIC3800, Australia
W. Chao
Affiliation:
Department of Materials Science and Engineering, Monash University, VIC3800, Australia
E. Drath Bøjesen
Affiliation:
Monash Centre for Electron Microscopy, Monash University, VIC3800, Australia
Y. Guo
Affiliation:
Department of Materials Science and Engineering, Monash University, VIC3800, Australia
M. Krajnak
Affiliation:
Department of Materials Science and Engineering, Monash University, VIC3800, Australia
W. Li
Affiliation:
Department of Materials Science and Engineering, Monash University, VIC3800, Australia
C. L. Zheng
Affiliation:
Monash Centre for Electron Microscopy, Monash University, VIC3800, Australia

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 174 - 175
Copyright
© Microscopy Society of America 2018 

References

[1] Uchida, M. Tonomura, A. Nature 464 2010) p. 737.Google Scholar
[2] Verbeeck, J., Tian, H. Schattschneider, P. Nature 467 2010) p. 301.Google Scholar
[3] McMorran, B. J., et al, Science 331 2011) p. 192.Google Scholar
[4] Zheng, C. L., Petersen, T. C., Kirmse, H., Neumann, W., Morgan, M. F. Etheridge, J. Phys Rev Lett 119 2017 174801.Google Scholar
[5] Nakashima, P. H., Moodie, A. F. Etheridge, J. PNAS 110 2013) p. 14144.Google Scholar
[6] Nguyen, D. T., Findlay, S. D. Etheridge, J. Ultramicroscopy 184 2018) p. 143.Google Scholar
[7] Tate, M. W., et al, Microscopy and Microanalysis 22 2016) p. 237.Google Scholar
[8] The authors acknowledge funding from the Australian Research Council grants DP150104483, DP160104679 and LE0454166.Google Scholar