Hostname: page-component-78c5997874-g7gxr Total loading time: 0 Render date: 2024-11-06T09:53:13.063Z Has data issue: false hasContentIssue false
  • English
  • Français

Characterization of Interfacial Misfit Array Formation for GaSb Growth on GaAs by Transmission Electron Microscopy

Published online by Cambridge University Press:  26 July 2009

S Huang ,
G Balakrishnan  and
D Huffaker
S Huang
Affiliation:
University of New Mexico
G Balakrishnan
Affiliation:
University of New Mexico
D Huffaker
Affiliation:
University of California,Los Angeles

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 1062 - 1063
Copyright
Copyright © Microscopy Society of America 2009