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Characterization of Interfacial Misfit Array Formation for GaSb Growth on GaAs by Transmission Electron Microscopy

Published online by Cambridge University Press:  26 July 2009

S Huang
Affiliation:
University of New Mexico
G Balakrishnan
Affiliation:
University of New Mexico
D Huffaker
Affiliation:
University of California,Los Angeles

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2009