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Volume 15 - April 2009

Contents

Page 26 of 47

Instrumentation and Techniques

In Situ Microscopy: Real Time Correlation of Structure, Processing, and Properties

Abstract

  • Nano-Scale Compositional Heterogeneity in Pr-doped CeO2

  • V Sharma, K Eberhardt, R Sharma, P Crozier
  • Published online by Cambridge University Press:
    26 July 2009, pp. 700-701
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In-Situ Tensile Observation of Deformation Twin in TWIP Steel Using TEM

  • S-I Baik, T-Y Ahn, W-P Hong, Y-S Jung, Y-K Lee, Y-W Kim
  • Published online by Cambridge University Press:
    26 July 2009, pp. 702-703
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Size Effects on the Melting Temperature of Silver Nanoparticles: In-Situ TEM Observations

  • M Asoro, J Damiano, PJ Ferreira
  • Published online by Cambridge University Press:
    26 July 2009, pp. 706-707
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In-Situ Electrical Measurements of Vertically Aligned Nanostructures

  • G McMahon, T Paudel, ZF Ren, MJ Naughton
  • Published online by Cambridge University Press:
    26 July 2009, pp. 708-709
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In-Situ HR-TEM Characterizations on Individual Carbon Nanotubes During its Manipulation, Deformation and Growth

  • C Jin, K Suenaga, S Iijima
  • Published online by Cambridge University Press:
    26 July 2009, pp. 710-711
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In-Situ TEM Characterization of the Effect of Interfaces on Charge Transport in Cu(In,Ga)Se2 Thin Film Solar Cells

  • G Östberg, E Yucelen, K Svensson, E Olsson
  • Published online by Cambridge University Press:
    26 July 2009, pp. 712-713
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • The Titan Environmental Transmission Electron Microscope: Specifications, Considerations and First Results

  • TW Hansen, JB Wagner, JR Jinschek, RE Dunin-Borkowski
  • Published online by Cambridge University Press:
    26 July 2009, pp. 714-715
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In-Situ Observation and Characterization of Structural Evolution in a Phase-Change Memory Device by TEM-STM

  • D Cha, SY Park, SJ Ahn, H Horii, DK Kim, YK Kim, SO Park, UI Jung, MJ Kim, J Kim
  • Published online by Cambridge University Press:
    26 July 2009, pp. 716-717
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In-Situ and Ex-Situ Electron Microscopy and Spectroscopy Investigation of Capacity Fade Mechanisms of Rechargeable Li-S Batteries

  • VP Oleshko, C Scordilis-Kelley, A Xiao
  • Published online by Cambridge University Press:
    26 July 2009, pp. 718-719
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In-Situ Observation of the Reaction Between Iron and Carbon in TEM

  • N Ishikawa, T Aoyagi, T Kimura, K Furuya, T Harada, T Inami
  • Published online by Cambridge University Press:
    26 July 2009, pp. 720-721
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In-Situ Fracture of Silicon Nanoparticles

  • JD Nowak, AR Beaber, O Ugurlu, WW Gerberich, OL Warren
  • Published online by Cambridge University Press:
    26 July 2009, pp. 722-723
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

In-Situ Microscopy: Real Time Correlation of Structure, Processing, and Properties

Abstract

  • In-Situ TEM Observation of Domain Behavior in Multiferroic Structures Under Applied DC Bias

  • C Winkler, L Martin, C Johnson, M Taheri
  • Published online by Cambridge University Press:
    26 July 2009, pp. 724-725
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In-Situ and Ex-situ TEM Imaging and Spectroscopy Study of Li-Ion Battery

  • CM Wang, W Xu, ZM Nie, D Choi, DH Wang, ZG Yang, JG Zhang, S Thevuthasan, J Liu, DR Baer
  • Published online by Cambridge University Press:
    26 July 2009, pp. 726-727
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Microtomography Versus Optical Microscopy in the Examination of Interior Features in Ice

  • R Obbard, I Baker
  • Published online by Cambridge University Press:
    26 July 2009, pp. 728-729
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Determination of Sintering Parameters from In-Situ Aberration-Corrected STEM Imaging of Coalescence in Pt Nanoparticles

  • M Asoro, Y Shao-Horn, D Kovar, LF Allard, PJ Ferreira
  • Published online by Cambridge University Press:
    26 July 2009, pp. 730-731
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Nanocharacterization and Control of Supported Ni Nanocatalysts for Partial Oxidation of Methane

  • R Banerjee, S Chenna, P Crozier
  • Published online by Cambridge University Press:
    26 July 2009, pp. 732-733
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In-Situ Tribology Study of Nanoprobe Sliding on Defective Crystalline Surface

  • Y Liao, LD Marks
  • Published online by Cambridge University Press:
    26 July 2009, pp. 734-735
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Are Dislocations Present in Nanoparticles?: Fourier Filtering of Images Obtained From In-Situ TEM Nanoindentation

  • C Carlton, PJ Ferreira
  • Published online by Cambridge University Press:
    26 July 2009, pp. 736-737
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Electron Diffraction and Imaging Techniques for Quantitative Structure Determination

Abstract

  • Towards Routine Structure Solution using Precession Electron Diffraction

  • PA Midgley, A Eggeman, T White, E Bithell
  • Published online by Cambridge University Press:
    26 July 2009, pp. 738-739
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 26 of 47