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Volume 15 - April 2009

Contents

Page 24 of 47

Instrumentation and Techniques

Three-Dimensional Imaging in the Biological and Materials Sciences: Bridging Nano and Micron Scales

Abstract

  • Possible Skin Fragment Evidence is Found in Incomplete Fingerprints

  • A Villena, A Calabro, D Becker, J Morales
  • Published online by Cambridge University Press:
    26 July 2009, pp. 620-621
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • 3D Confocal Imaging of Pollen

  • S Vitha, VM Bryant, A Zwa, A Holzenburg
  • Published online by Cambridge University Press:
    26 July 2009, pp. 622-623
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Serial Block-face Scanning Electron Microscopic Correlative Methods for Mapping Neuronal Interconnectivity

  • JL Serrano-Velez, J Mancuso, II Torres-Vazquez, E Rosa-Molinar
  • Published online by Cambridge University Press:
    26 July 2009, pp. 624-625
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Simplifying Minimum Dose Electron Tomography

  • RT Harmon, S Meyer, CR Booth, J Wilbrink
  • Published online by Cambridge University Press:
    26 July 2009, pp. 626-627
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Guidelines for Adapting Light Microscopy Deconvolution Methods to 3D Biological STEM

  • B Northan, R Sougrat, N de Jonge
  • Published online by Cambridge University Press:
    26 July 2009, pp. 628-629
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • TEM and STEM Tomography for thick polymer sample

  • T Kaneko, S Motoki, Y Aoyama, H Nishioka, Y Ohkura, Y Kondo, H Jinnai
  • Published online by Cambridge University Press:
    26 July 2009, pp. 630-631
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • 3-D Scanning Transmission Electron Microscopy of Carbide-Derived Carbons for Electrical Energy Storage

  • S Widgeon, M Gass, AL Bleloch, S-H Yeon, Y Gogotsi, I Arslan
  • Published online by Cambridge University Press:
    26 July 2009, pp. 632-633
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Three-dimensional Observation of Carbon Nanostructures with Confocal Scanning Tansmission Electron Microscopy

  • A Hashimoto, M Shimojo, K Mitsuishi, M Takeguchi
  • Published online by Cambridge University Press:
    26 July 2009, pp. 636-637
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • The 3-D Pore Structure of Pd Nanoparticles as a Function of Temperature

  • M Klein, M Ong, B Jacobs, D Robinson, S Fares, I Arslan
  • Published online by Cambridge University Press:
    26 July 2009, pp. 638-639
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Grain Boundary Curvature Analysis of β -Grains in Ti-21S

  • D Rowenhorst, A Lewis, G Spanos
  • Published online by Cambridge University Press:
    26 July 2009, pp. 640-641
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Fast Throughput Low Voltage Scanning Transmission Electron Microscope Imaging of Nano-Resolution Three Dimensional Tissue

  • M Bolorizadeh, HF Hess
  • Published online by Cambridge University Press:
    26 July 2009, pp. 642-643
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Analysis of Simian Virus 40 Chromatin Structure by Cryo-Electron Tomography

  • P Keller, O Ben-Nun Shaul, B Heymann, D Winkler, A Oppenheim, AC Steven
  • Published online by Cambridge University Press:
    26 July 2009, pp. 644-645
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Electron-Tomography of a Temperature-Sensitive Morphogenic Mutant of Rous Sarcoma Virus (RSV)

  • C Butan, PM Lokhandwala, DC Winkler, RC Craven, AC Steven
  • Published online by Cambridge University Press:
    26 July 2009, pp. 646-647
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

High Resolution Scanning Microscopy - Ions to Electrons

Abstract

  • Choosing a Beam-Electrons,Protons, He or Ga ions?

  • DC Joy, R Ramachandra, BJ Griffin
  • Published online by Cambridge University Press:
    26 July 2009, pp. 648-649
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Contrast Mechanisms in Ga+ Ion Induced Secondary Electron Images

  • LA Giannuzzi, M Utlaut
  • Published online by Cambridge University Press:
    26 July 2009, pp. 650-651
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • One Year On: New and Unique Applications of He Ion Microscopy

  • DC Bell, N Erdman, MA Jepson, C Rodenburg, BJ Inkson
  • Published online by Cambridge University Press:
    26 July 2009, pp. 652-653
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Advances in High Resolution Helium Ion Microscope (HIM) Imaging

  • C Sanford, J Notte, L Scipioni, S McVey, R Hill, S Sijbrandij, L Farkas
  • Published online by Cambridge University Press:
    26 July 2009, pp. 654-655
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Superior Imaging Quality of Scanning Helium-Ion Microscopy: a Look at Beam-Sample Interactions,

  • D Cohen-Tanugi, N Yao
  • Published online by Cambridge University Press:
    26 July 2009, pp. 656-657
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Precision Material Modification and Patterning with Helium Ions

  • DC Bell, M Lemme, CM Marcus
  • Published online by Cambridge University Press:
    26 July 2009, pp. 658-659
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 24 of 47