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Volume 15 - April 2009

Contents

Page 28 of 47

Instrumentation and Techniques

Metallographic Techniques & Materials Characterization

Abstract

  • Methods of Evaluating EBSD Sample Preparation

  • MM Nowell, SI Wright, JO Carpenter, R Witt
  • Published online by Cambridge University Press:
    26 July 2009, pp. 780-781
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Observing Solidification Patterns in Rapidly Solidified Alloys and Powders

  • J Steele
  • Published online by Cambridge University Press:
    26 July 2009, pp. 782-783
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Failure Analysis and Design of Cu-Be Alloy Clips

  • F Schmidt
  • Published online by Cambridge University Press:
    26 July 2009, pp. 784-785
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Electrolytic Polishing of Cold Worked Zr-2.5Nb for the Examination of Zr-Hydrides

  • A Lockley
  • Published online by Cambridge University Press:
    26 July 2009, pp. 788-789
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Ion-Beam Etching Techniques in Uranium Metallography

  • JJ Frafjord, RL Bridges, SJ Dekanich
  • Published online by Cambridge University Press:
    26 July 2009, pp. 790-791
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • TEM Observation of Twin Evolution in Austenitic TWIP steel

  • J Han, M Kim, HN Han
  • Published online by Cambridge University Press:
    26 July 2009, pp. 792-793
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • TEM Study of Lizardite-1T Particles in Toluene Solvent

  • J Yan, XZ Li, JY Jiang, L Tan
  • Published online by Cambridge University Press:
    26 July 2009, pp. 794-795
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Microscopy and Analysis in Forensic Science

Abstract

  • Applications of Microscopy and Microanalysis in US FDA Forensic Cases

  • SF Platek, JB Crowe, N Ranieri, M Witkowski
  • Published online by Cambridge University Press:
    26 July 2009, pp. 796-797
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Forensic Science Scanning Electron Microscopy, and News in this Field

  • M Kotrly, I Turkova, V Grunwaldova
  • Published online by Cambridge University Press:
    26 July 2009, pp. 798-799
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Study of Down-Range GSR Deposition as a Function of Firearms Type and Ammunition Caliber

  • AJ Schwoeble
  • Published online by Cambridge University Press:
    26 July 2009, pp. 800-801
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Raw Data and Metadata: Comprehensive and Ethical Collection, Storage, Manipulation and Retrieval of Images

Abstract

  • Securing and Authenticating Images with On-Image Metadata

  • C Bradley, J Mancuso
  • Published online by Cambridge University Press:
    26 July 2009, pp. 802-803
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • The Darkroom is Closed. Introducing Digital Image Ethics to a New Generation.

  • D Cromey
  • Published online by Cambridge University Press:
    26 July 2009, pp. 804-805
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Applying Engineering Information Management Principles to Microscopy

  • NHM Caldwell, CA McMahon, MJ Darlington, P Heisig, DM Holburn, PJ Clarkson
  • Published online by Cambridge University Press:
    26 July 2009, pp. 806-807
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Innovations in Knowledge Management with GMS

  • J Wilbrink, R Harmon
  • Published online by Cambridge University Press:
    26 July 2009, pp. 808-809
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Open Microscopy and Open Semantics

  • E Neumann
  • Published online by Cambridge University Press:
    26 July 2009, pp. 810-811
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Contamination Control in Electron and Ion Microscopy

Abstract

  • Contamination Removal Rates Improved by New Impedance Matching Network, for the Evactron® De-Contaminator

  • CG Morgan, R Vane
  • Published online by Cambridge University Press:
    26 July 2009, pp. 812-813
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Modeling Decontamination by Downstream Plasma Cleaning using Both Quartz, Crystal Microbalance and UV-Visible Spectroscopic Data

  • CG Morgan, R Vane
  • Published online by Cambridge University Press:
    26 July 2009, pp. 814-815
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Plasma Cleaning Applications for Surface Science and Model Catalyst Samples

  • D Zemlyanov, B Fingland, A Wei, S Durbin, F Ribeiro
  • Published online by Cambridge University Press:
    26 July 2009, pp. 816-817
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • The Efficiency of in-situ Cleaning Methods for Minimizing Electron Beam Induced Contamination

  • H Parvaneh, H Demers, E Lifshin
  • Published online by Cambridge University Press:
    26 July 2009, pp. 818-819
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 28 of 47