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Volume 15 - April 2009

Contents

Page 21 of 47

Instrumentation and Techniques

Failure Analyses: Practical Metallography/Fractography in Case Studies

Abstract

  • High Contact Resistance in Spring Loaded Micro-Switches

  • K Wasag
  • Published online by Cambridge University Press:
    26 July 2009, pp. 498-499
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Counting on Fatigue- Striations and Their Measure

  • P DeVries, K Ruth, D Dennies
  • Published online by Cambridge University Press:
    26 July 2009, pp. 500-501
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Fractographic Analyses of Creep and Fatigue Induced Failures in an Alpha Titanium-Aluminum Alloy

  • MC Brandes, A Bhattacharjee, MJ Mills, JC Williams
  • Published online by Cambridge University Press:
    26 July 2009, pp. 502-503
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Impact Fatigue Failure of Ordnance Components

  • F Schmidt, D Norfleet
  • Published online by Cambridge University Press:
    26 July 2009, pp. 504-505
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Disastrous Failure of a Carbide-Studded Cutting Disc

  • M Panzenböck
  • Published online by Cambridge University Press:
    26 July 2009, pp. 506-507
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Grain Structure at Crack Path in Fatigued Nano-Crystalline Ni

  • L-C Lai, W-A Chiou, JC Earthman
  • Published online by Cambridge University Press:
    26 July 2009, pp. 508-509
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Problem Solving Using Microanalysis in the Real World

Abstract

  • A Multifaceted Approach to Particle Analysis

  • H Lowers
  • Published online by Cambridge University Press:
    26 July 2009, pp. 510-511
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Using DTSA-II to Simulate and Interpret an X-ray Spectrum Image from a K411 Microparticle

  • N Ritchie
  • Published online by Cambridge University Press:
    26 July 2009, pp. 512-513
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Use of Multilayer Correction Procedures to Improve the Quantitative Electron Microprobe Analyses of Coated Insulating Specimens

  • J Armstrong
  • Published online by Cambridge University Press:
    26 July 2009, pp. 514-515
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Electron Probe Microanalysis of Thin Films and Multilayers Using the X-FILM Computer Code

  • X Llovet, C Merlet
  • Published online by Cambridge University Press:
    26 July 2009, pp. 516-517
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Challenges Involved In X-Ray Microanalysis Of The Mineral Kernite [Na2B4O6(OH)2P3H2O]

  • EP Vicenzi, D Meier, JM Davis
  • Published online by Cambridge University Press:
    26 July 2009, pp. 518-519
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Calculating the Detector Solid Angle in X-ray Energy Dispersive Spectroscopy

  • NJ Zaluzec
  • Published online by Cambridge University Press:
    26 July 2009, pp. 520-521
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • The Discovery and Characterisation of a New U Mineral from Ilimaussaq Alkali Complex – Greenland

  • CM MacRae, A Torpy, N Wilson, I Grey, R Townend
  • Published online by Cambridge University Press:
    26 July 2009, pp. 522-523
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Quantitative Metallography And Microanalytical Analysis Of Particles In Iron Rivets Recovered From The Wreck Of The RMS Titanic

  • T Foecke, J Hooper-McCarty
  • Published online by Cambridge University Press:
    26 July 2009, pp. 524-525
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • EPMA of K and Na in Two Types of Aged NOx Catalysts for Diesel Engines

  • J Hangas, G Cavataio, Y Cheng
  • Published online by Cambridge University Press:
    26 July 2009, pp. 526-527
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Prospects for Single Standard Quantitative Analysis with SDD

  • P Statham
  • Published online by Cambridge University Press:
    26 July 2009, pp. 528-529
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • A Solution to the Problem of X-Ray Mapping Samples with Surface Roughness

  • R Anderhalt, D Chan, M Lupu
  • Published online by Cambridge University Press:
    26 July 2009, pp. 530-531
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Elevation Resolved Elemental Mapping with SEM/EDS

  • J Konopka, M Betts
  • Published online by Cambridge University Press:
    26 July 2009, pp. 532-533
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Transitioning Laser Ablation ICP-MS from Research Applications to Routine Trace Element Microanalysis: A Look at Quantitative Trace Element Analyses and Imaging

  • AE Koenig
  • Published online by Cambridge University Press:
    26 July 2009, pp. 536-537
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 21 of 47