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X-Max Large Area SDD Detectors - Creating a Real Impact on Nano-Science

Published online by Cambridge University Press:  26 July 2009

CL Collins ,
J Holland ,
SR Burgess  and
N Rowlands
CL Collins
Affiliation:
Oxford Instruments NanoAnalysis,United Kingdom
J Holland
Affiliation:
Oxford Instruments NanoAnalysis,United Kingdom
SR Burgess
Affiliation:
Oxford Instruments NanoAnalysis,United Kingdom
N Rowlands
Affiliation:
Oxford Instruments Inc

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 172 - 173
Copyright
Copyright © Microscopy Society of America 2009