Microscopy and Microanalysis: Volume 16 -

MAM volume 16 issue S1 Cover and Back matter
Published online by Cambridge University Press:

22 June 2010, pp. b1-b3
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Morphological Characterization of Bacteria Using the Atmospheric Scanning Electron Microscope (ASEM)
K Teramoto, H Nishiyama, Y Maruyama, Y Konyuuba, Y Abe, D Guarrera, M Suga, C Sato
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01 August 2010, pp. 50-51
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Gigantic Montages with a Fully Automated FE-SEM (Serial Sections of a Mouse Brain Tissue)
K Ogura, M Yamada, O Hirahara, M Mita, N Erdman, C Nielsen
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01 August 2010, pp. 52-53
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Extremely Low Magnification EBSD with an FE-SEM
Y Yamamoto, K Ogura, K Kawauchi, M Shibata, N Erdman, C Nielsen
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01 August 2010, pp. 54-55
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

High Order Aberration Correction in a Post-Column Energy Filter
N Menon, M Barfels, RD Twesten
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01 August 2010, pp. 56-57
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Gas Assisted E-beam Lithography Using the JSM-7600F Ultra-High Resolution Schottky FEG-SEM and OmniGIS
N Erdman, A Laudate, C Hartfield
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01 August 2010, pp. 58-59
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

3D Atom Probe for Nano-scale Chemical Analysis
A Davis, F Horreard, I Martin, R Benbalagh, L Renaud
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01 August 2010, pp. 60-61
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Progress in Dynamic EBSD Pattern Simulation
G Nolze, A Winkelmann
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01 August 2010, pp. 62-63
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

300kV Performance of a 10k x 10k Scintillator- and Fiber-Coupled CCD Camera for Transmission Electron Microscopes
B Lee, B Mollon, P Mooney
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01 August 2010, pp. 64-65
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Atomic-level Chemical Analysis by EELS and XEDS in Aberration- corrected Scanning Transmission Electron Microscopy
M Watanabe, E Okunishi, T Aoki
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01 August 2010, pp. 66-67
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Applications of spherical aberration correction in STEM and TEM
S Lazar, J Etheridge, C Dwyer, B Freitag, GA Botton
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01 August 2010, pp. 68-69
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Slow and Fast Atomic Motion Observed by Aberration-Corrected STEM
OL Krivanek, N Dellby, MF Murfitt, ZS Szilagyi, MF Chisholm, K Suenaga
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01 August 2010, pp. 70-71
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

An in-situ EELS study of Co-based Fischer-Tropsch Catalysts
Y Zhao, TE Feltes, JR Regalbuto, RJ Meyer, RF Klie
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01 August 2010, pp. 72-73
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Annular Dark-Field Imaging of Atomic Substitution in Single-Layer Materials
MF Chisholm, N Dellby, MF Murfitt, V Nicolosi, MP Oxley, TJ Pennycook, GJ Corbin, ZS Szilagyi, SJ Pennycook, OL Krivanek
Published online by Cambridge University Press:

01 August 2010, pp. 74-75
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Processing and Aberration-Corrected Imaging of Novel Low-Dimensional Nanostructures
V Nicolosi, Z Aslam, J Kim, OL Krivanek, MF Chisholm, TJ Pennycook, AI Kirkland, N Grobert, PD Nellist
Published online by Cambridge University Press:

01 August 2010, pp. 76-77
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

An Investigation of Structure and Electrochemical Cycle Stability of Li[Li0.2Ni0.2Mn0.6]O2 by using Aberration Corrected Z-contrast Imaging and EELS
M Chi, C Fell, S Meng
Published online by Cambridge University Press:

01 August 2010, pp. 78-79
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Annular Bright Field Scanning Transmission Electron Microscopy Imaging Dynamics
SD Findlay, N Shibata, H Sawada, E Okunishi, Y Kondo, S Azuma, Y Ikuhara
Published online by Cambridge University Press:

01 August 2010, pp. 80-81
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Analytical Aberration-Corrected STEM of Ferroelectric Functional Interfaces
QM Ramasse, M Arredondo, M Weyland, R Mahjoub, I Vrejoiu, D Hesse, ND Browning, M Alexe, P Munroe, V Nagarajan
Published online by Cambridge University Press:

01 August 2010, pp. 82-83
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Understanding Atomic-Scale Phenomena in Functional Materials by Using STEM, ELNES, and Theoretical Calculations
T Mizoguchi, T Tohei, Y Sato, T Yamamoto, Y Ikuhara, H Ohta, H Hiramatsu, H Hosono
Published online by Cambridge University Press:

01 August 2010, pp. 84-85
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Atomic-Resolution Annular Bright-Field and Spectrum Imaging of Incommensurately-layered Ca3Co4O9
RF Klie, Q Qiao
Published online by Cambridge University Press:

01 August 2010, pp. 86-87
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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Volume 16 - July 2010

Back Cover (IBC, OBC) and matter

MAM volume 16 issue S1 Cover and Back matter

Instrumentation and Techniques Symposia

Vendor Symposium: Creating the Tools for Science

Abstract

Morphological Characterization of Bacteria Using the Atmospheric Scanning Electron Microscope (ASEM)

Gigantic Montages with a Fully Automated FE-SEM (Serial Sections of a Mouse Brain Tissue)

Extremely Low Magnification EBSD with an FE-SEM

High Order Aberration Correction in a Post-Column Energy Filter

Gas Assisted E-beam Lithography Using the JSM-7600F Ultra-High Resolution Schottky FEG-SEM and OmniGIS

3D Atom Probe for Nano-scale Chemical Analysis

Progress in Dynamic EBSD Pattern Simulation

300kV Performance of a 10k x 10k Scintillator- and Fiber-Coupled CCD Camera for Transmission Electron Microscopes

Aberration-Corrected Electron Microscopy: Exploring Materials Through New Eyes

Abstract

Atomic-level Chemical Analysis by EELS and XEDS in Aberration- corrected Scanning Transmission Electron Microscopy

Applications of spherical aberration correction in STEM and TEM

Slow and Fast Atomic Motion Observed by Aberration-Corrected STEM

An in-situ EELS study of Co-based Fischer-Tropsch Catalysts

Annular Dark-Field Imaging of Atomic Substitution in Single-Layer Materials

Processing and Aberration-Corrected Imaging of Novel Low-Dimensional Nanostructures

An Investigation of Structure and Electrochemical Cycle Stability of Li[Li0.2Ni0.2Mn0.6]O2 by using Aberration Corrected Z-contrast Imaging and EELS

Annular Bright Field Scanning Transmission Electron Microscopy Imaging Dynamics

Analytical Aberration-Corrected STEM of Ferroelectric Functional Interfaces

Understanding Atomic-Scale Phenomena in Functional Materials by Using STEM, ELNES, and Theoretical Calculations

Atomic-Resolution Annular Bright-Field and Spectrum Imaging of Incommensurately-layered Ca3Co4O9

Microscopy and Microanalysis

Refine listing

Actions for selected content:

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Volume 16 - July 2010

Back Cover (IBC, OBC) and matter

Instrumentation and Techniques Symposia

Vendor Symposium: Creating the Tools for Science

Abstract

Aberration-Corrected Electron Microscopy: Exploring Materials Through New Eyes

Abstract