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Annular Dark-Field Imaging of Atomic Substitution in Single-Layer Materials

Published online by Cambridge University Press:  01 August 2010

MF Chisholm ,
N Dellby ,
MF Murfitt ,
V Nicolosi ,
MP Oxley ,
TJ Pennycook ,
GJ Corbin ,
ZS Szilagyi ,
SJ Pennycook  and
OL Krivanek
MF Chisholm
Affiliation:
Oak Ridge National Laboratory
N Dellby
Affiliation:
Nion Co
MF Murfitt
Affiliation:
Nion Co
V Nicolosi
Affiliation:
University of Oxford, United Kingdom
MP Oxley
Affiliation:
Vanderbilt University
TJ Pennycook
Affiliation:
Vanderbilt University
GJ Corbin
Affiliation:
Nion Co
ZS Szilagyi
Affiliation:
Nion Co
SJ Pennycook
Affiliation:
Oak Ridge National Laboratory
OL Krivanek
Affiliation:
Nion Co

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 74 - 75
Copyright
Copyright © Microscopy Society of America 2010