Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-26T08:52:55.795Z Has data issue: false hasContentIssue false
  • English
  • Français

Slow and Fast Atomic Motion Observed by Aberration-Corrected STEM

Published online by Cambridge University Press:  01 August 2010

OL Krivanek ,
N Dellby ,
MF Murfitt ,
ZS Szilagyi ,
MF Chisholm  and
K Suenaga
OL Krivanek
Affiliation:
Nion Co
N Dellby
Affiliation:
Nion Co
MF Murfitt
Affiliation:
Nion Co
ZS Szilagyi
Affiliation:
Nion Co
MF Chisholm
Affiliation:
Oak Ridge National Laboratory
K Suenaga
Affiliation:
National Institute of Advanced Industrial Science and Technology

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 70 - 71
Copyright
Copyright © Microscopy Society of America 2010