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Microscopy and Microanalysis
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Volume 16 - July 2010

Contents

Page 11 of 57

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Instrumentation and Techniques Symposia

Aberration-Corrected Electron Microscopy: Exploring Materials Through New Eyes

Abstract

High-Resolution Secondary Electron Imaging of a FIB Prepared Si Sample with an Aberration Corrected Electron Microscope
M Konno, Y Suzuki, H Inada, K Nakamura, K Kimoto, Y Zhu
Published online by Cambridge University Press:

01 August 2010, pp. 128-129
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Probing for Chemically Functional Groups on Graphene Oxide in an Aberration-Corrected Electron Microscope
R Cieslinski, S Rozeveld, J Huang, P Specht, C Kisielowski
Published online by Cambridge University Press:

01 August 2010, pp. 130-131
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Limitations in Detecting a Single Dopant Atom Inside a Bulk Specimen
A Mittal, KA Mkhoyan
Published online by Cambridge University Press:

01 August 2010, pp. 132-133
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

On Direct Observation of Diffusion by Aberration-Corrected HREM
JT McKeown, Y-W Kim, WT Petuskey, M O'Keeffe, U Weierstall, JCH Spence
Published online by Cambridge University Press:

01 August 2010, pp. 134-135
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Minimizing 6-fold Symmetry and Chromatic Aberration by Using Ultra High Resolution Lens in Cs-Corrected STEM
K Nakamura, H Inada, M Konno, Y Suzuki, K Kimoto
Published online by Cambridge University Press:

01 August 2010, pp. 136-137
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Secondary Electron Imaging with an Aberration Corrected Scanning Transmission Electron Microscope
MP Balogh, I Dutta
Published online by Cambridge University Press:

01 August 2010, pp. 138-139
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Determination of Camera Modulation-Transfer Function by Electron Holography
RA McLeod, M Malac
Published online by Cambridge University Press:

01 August 2010, pp. 140-141
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Aberration-Corrected Lorentz Microscopy
NT Nuhfer, A Budruk, M De Graef
Published online by Cambridge University Press:

01 August 2010, pp. 142-143
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

3D Correlative Analytical STEM at the Atomic Scale
DC Bell, R Schillinger, D Kolmykov
Published online by Cambridge University Press:

01 August 2010, pp. 144-145
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Atomic Scale Characterization of LSFMO Thin Films Using Aberration Corrected STEM
M Gu, Y Takamura, ND Browning
Published online by Cambridge University Press:

01 August 2010, pp. 146-147
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Can We Solve the Atomic Structure of Small Au clusters by HAADF-STEM?
ZW Wang, F Yin, A Bruma, RE Palmer
Published online by Cambridge University Press:

01 August 2010, pp. 148-149
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Geometric Limits on Spatial Resolution for Cs Corrected STEM Analysis of Thick TEM Lamellae
J Bruley, J Ringnalda
Published online by Cambridge University Press:

01 August 2010, pp. 150-151
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Determining Resolution in an Aberration-Corrected Era: Why Your Probe Is Larger Than You Thought
R Hovden, HL Xin, DA Muller
Published online by Cambridge University Press:

01 August 2010, pp. 152-153
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Atomic Resolution Z-Contrast Imaging of the Interface Between Non-Polar a-ZnO Grown on r-Cut Al2O3 by Pulsed Laser Deposition
H Zhou, MF Chisholm, P Pant, J Gazquez, SJ Pennycook, J Narayan
Published online by Cambridge University Press:

01 August 2010, pp. 154-155
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

High-Speed Direct-Detection Electron Detector for the TEAM Project
P Denes, M Battaglia, D Contarato, D Doering, P Giubilato, D Gnani, B Krieger, VR Radmilovic
Published online by Cambridge University Press:

01 August 2010, pp. 156-157
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

5.4 nm Spatial Resolution Obtained from an Aberration-Corrected Photoemission Electron Microscope Utilizing an Electrostatic Mirror
RC Word, G Rempfer, L Almaraz, T Dixon, P Witham, R Könenkamp
Published online by Cambridge University Press:

01 August 2010, pp. 158-159
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Towards the Thinking Microscope
OS Ovchinnikov, S Jesse, SV Kalinin, HJ Chang, SJ Pennycook, AY Borisevich
Published online by Cambridge University Press:

01 August 2010, pp. 160-161
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Visualization of Lithium Atoms in LiV2O4 by a Spherical Aberration Corrected Electron Microscope
Y Oshima, H Sawada, E Okunishi, Y Kondo, S Niitaka, H Takagi, Y Tanishiro, K Takayanagi
Published online by Cambridge University Press:

01 August 2010, pp. 162-163
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

A Simple Autofocus Technique for Aberration Corrected TEM
G Möbus
Published online by Cambridge University Press:

01 August 2010, pp. 164-165
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

FIB Science and Applications in Materials and Biology

Abstract

Latest Developments in FIB Technology and Applications
L Giannuzzi
Published online by Cambridge University Press:

01 August 2010, pp. 166-167
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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