Instrumentation Sciences
A02.02 The Electron Microscope of the Future: Merging the SEM, the STEM and the Ion Microscope
Abstract
The Difference Between Secondary Electron Imaging In Variable Pressure SEM And Conventional SEM: Can They Ever Be The Same?
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- 09 October 2013, pp. 368-369
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Layer Number Contrast of CVD-derived Graphene in Low Voltage Scanning Electron Microscopy
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- 09 October 2013, pp. 370-371
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A02.03 The Electron Microscope of the Future: Merging the SEM, the STEM and the Ion Microscope
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Scanning Electron Microscopy With Slow Electrons
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- 09 October 2013, pp. 372-373
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High-Resolution SEM with Coupled Transmission Mode and EDX for Quick Characterization of Micro- and Nanocapsules for self-Healing Anti-Corrosion Coatings
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- 09 October 2013, pp. 374-375
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Low-Energy Electron Diffractive Imaging Based on a Single-Atom Electron Source
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- 09 October 2013, pp. 376-377
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Combining Operando X-ray Absorption Spectroscopy and Sub-Ångstrom Environmental Electron Microscopy
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- 09 October 2013, pp. 378-379
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The Future SEM Sees 3 Dimensions... Bringing Deconvolution Techniques to the Electron Microscope.
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- 09 October 2013, pp. 380-381
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A02.P1 The Electron Microscope of the Future: Merging the SEM, the STEM and the Ion Microscope
Abstract
Single-atom Tip as an Emitter of Gas Field Ion Source
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- 09 October 2013, pp. 382-383
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Novel Silicon Nanowire-based Electron Detector Utilized in Next Generation Scanning Electron Microscopes
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- 09 October 2013, pp. 384-385
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Low voltage STEM observation in the latest FE-SEM
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- Published online by Cambridge University Press:
- 09 October 2013, pp. 386-387
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Second and Third Order Aperture Aberrations of the Compensated Quadrupole Doublet
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- 09 October 2013, pp. 388-389
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Simultaneous Bright Field and Dark Field STEM-IN-SEM Imaging of Hard-Soft Composites and Crystalline Materials
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- 09 October 2013, pp. 390-391
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A03.01 New Opportunities for In-situ Techniques and Instruments
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Exploiting a direct detection camera for in-situ microscopy
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- 09 October 2013, pp. 392-393
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In-situ Raman Spectroscopy in a TEM
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- 09 October 2013, pp. 394-395
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In-Situ Environmental Atom Probe Tomography for Studying Gas-Solid Reactions In Extreme Environments: Instrumentation and Results
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- 09 October 2013, pp. 396-397
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The Application of X-ray Micro- and Nano- Scale Computed Tomography to the Morphological and In-situ Dynamic Study of Polymer Foam Materials
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- 09 October 2013, pp. 398-399
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Connectomics: The dense reconstruction of neuronal circuits using volume electron microscopy
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- 09 October 2013, pp. 400-401
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A03.02 New Opportunities for In-situ Techniques and Instruments
Abstract
Suspended Microsystems for In-situ TEM Studies of Processes in Gases and Liquids
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- 09 October 2013, pp. 402-403
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Nanofluidic Cells With Controlled Path Length and Liquid Flow for Rapid, High-Resolution in situ Electron Microscopy
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- 09 October 2013, pp. 404-405
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Development of Reinforced Silicon Nitride Membranes for in situ Liquid Electron Microscopy
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- 09 October 2013, pp. 406-407
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