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Volume 19 - August 2013

Contents

Page 28 of 70

Instrumentation Sciences

A01.P1 Gertrude Rempfer Memorial Symposium on Advances in Electron Optics and Aberration-Corrected Electron Microscopy

Abstract

  • CdSe Heterostructures for Photocatalytic Hydrogen Generation

  • P. Tongying, M. Kuno, G. Krylova
  • Published online by Cambridge University Press:
    09 October 2013, pp. 328-329
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Characterization of a Double-tip Field Emission Source Using Inline Axial Holography

  • J. Ciston, C. Song, C. Ophus
  • Published online by Cambridge University Press:
    09 October 2013, pp. 330-331
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • TEM Characterization of 3D InAs QDs Grown under Subcritical Deposition

  • S. Rouvimov, N. Ledentsov, V. Shchukin
  • Published online by Cambridge University Press:
    09 October 2013, pp. 332-333
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Electrical Activity of Defects in CdTe Solar Cells via Aberration-corrected STEM

  • C. Li, Y. Wu, A.R. Lupini, A. Mouti, J. Poplawsky, W. Yin, N. Paudel, M.A. Jassim, Y. Yan, S.J. Pennycook
  • Published online by Cambridge University Press:
    09 October 2013, pp. 334-335
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Anomalous Diffusion of Lanthanum from LaFeO3 to CaTiO3 and the Formation of Locally Ordered LaxCa1-xTiO3-δ Perovskite Phase Therein

  • M.B. Katz, H. Liu, G.W. Graham, X. Pan
  • Published online by Cambridge University Press:
    09 October 2013, pp. 338-339
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Electronic Signature of Magnetic Moment and Fe-Vacancy Order in Fe-Based TlFe1.6Se2 Investigated by STEM/EELS

  • C. Cantoni, A.F. May, J.E. Mitchell, A.S. Sefat, M.A. McGuire, B.C. Sales
  • Published online by Cambridge University Press:
    09 October 2013, pp. 340-341
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Rational Design of Helical Nanotubes from Self-assembly of Coiled-coil Lock Washers

  • C. Xu, E.R. Wright, A. Mehta, L.C. Ser-pell, X. Zuo, J.S. Wall, V.P. Conticello
  • Published online by Cambridge University Press:
    09 October 2013, pp. 342-343
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Microscopic Characterization of MBE-grown Dilute-nitride Alloys of GaAsNx (0.01<x<0.04) on GaAs (001) for Photovoltaic Solar Cells

  • D. Tang, G.-K. Vijaya, A. Freundlich, D.J. Smith
  • Published online by Cambridge University Press:
    09 October 2013, pp. 344-345
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Strain Analysis of Semiconductor Device by Moiré Fringes in STEM Image

  • N. Endo, Y. Kondo
  • Published online by Cambridge University Press:
    09 October 2013, pp. 346-347
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Size Distribution, Imaging and Growth Mechanisms of Self-Assembled InAs Quantum Wires on Vicinal Substrates

  • A. Scullion, D.A. Thompson, G.A. Botton
  • Published online by Cambridge University Press:
    09 October 2013, pp. 348-349
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A02.01 The Electron Microscope of the Future: Merging the SEM, the STEM and the Ion Microscope

Abstract

  • SPM integration into SEM/FIB/SAM systems New opportunities?...or only integration problems?

  • W. Heichler
  • Published online by Cambridge University Press:
    09 October 2013, pp. 350-351
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Modeling iSE Emission for Ion Beam Imaging

  • D.C. Joy, B. Griffin
  • Published online by Cambridge University Press:
    09 October 2013, pp. 352-353
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Towards SIMS on the Helium Ion Microscope: Detection Limits and Experimental Results on the ORION

  • D. Dowsett, L. Pillatsch, N. Vanhove, T. Wirtz, S. Sijbrandij, J. Notte
  • Published online by Cambridge University Press:
    09 October 2013, pp. 354-355
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Correlative Microscopy Using SIMS For High-Sensitivity Elemental Mapping

  • T. Wirtz, D. Dowsett, N. Vanhove, Y. Fleming
  • Published online by Cambridge University Press:
    09 October 2013, pp. 356-357
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Theoretical 3D Imaging with He+ Ions

  • L.A. Giannuzzi
  • Published online by Cambridge University Press:
    09 October 2013, pp. 358-359
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A02.02 The Electron Microscope of the Future: Merging the SEM, the STEM and the Ion Microscope

Abstract

  • High Resolution Imaging and X-Ray Microanalysis at High Count Rate: The Supreme Achievement in Materials Characterization

  • R. Gauvin, D.C. Joy, N. Brodusch, H. Demers, P. Woo
  • Published online by Cambridge University Press:
    09 October 2013, pp. 360-361
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Simultaneous Bright Field and Dark Field STEM-IN-SEM Imaging of Polymer Nanocomposites

  • B.S. Patel, M. Watanabe
  • Published online by Cambridge University Press:
    09 October 2013, pp. 362-363
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • X-ray Quantitative Microanalysis with an Annular Silicon Drift Detector

  • H. Demers, N. Brodusch, D.C. Joy, P. Woo, R. Gauvin
  • Published online by Cambridge University Press:
    09 October 2013, pp. 364-365
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Fine Structure of Core Loss Excitations in EELS by Monte Carlo Simulation

  • M. Attarian Shandiz, F. Salvat, R. Gauvin
  • Published online by Cambridge University Press:
    09 October 2013, pp. 366-367
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Page 28 of 70