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The Difference Between Secondary Electron Imaging In Variable Pressure SEM And Conventional SEM: Can They Ever Be The Same?

Published online by Cambridge University Press:  09 October 2013

B.J. Griffin ,
D.C. Joy  and
J.R. Michael
B.J. Griffin
Affiliation:
D.C. Joy
Affiliation:
J.R. Michael
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 368 - 369
Copyright
Copyright © Microscopy Society of America 2013