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Volume 19 - August 2013

Contents

Page 27 of 70

Education

X90.01 Microscopy in the Classroom - Strategies for Education and Outreach

Abstract

  • Wright-Patterson Air Force Base Educational Outreach Program

  • J. Tiley, K. Stultz
  • Published online by Cambridge University Press:
    09 October 2013, pp. 288-289
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • The National Nanotechnology Infrastructure Network's Education and Outreach Programs - Helping student understand the tools of nanotechnology

  • N. Healy
  • Published online by Cambridge University Press:
    09 October 2013, pp. 290-291
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

X90.02 Microscopy in the Classroom - Strategies for Education and Outreach

Abstract

  • A Remote Online Microscopy Lab as a Tool for K-12 Science Education and a Platform for Teacher-Scientist Partnerships

  • E.H. Ferrin, A. Pratt, K. Jona
  • Published online by Cambridge University Press:
    09 October 2013, pp. 292-293
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Short Courses for Scanning Electron Microscopy and X-ray Microanalysis

  • C. Lyman
  • Published online by Cambridge University Press:
    09 October 2013, pp. 294-295
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

X90.P1 Microscopy in the Classroom - Strategies for Education and Outreach

Abstract

  • A Virtual Microscope for Use in Online and Onsite Biology Labs

  • T. Kawakami, G.M. Cohen, J. Zhong
  • Published online by Cambridge University Press:
    09 October 2013, pp. 296-297
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Two Opitcal Techniques for Observing Hair Cuticles in the Classroom

  • G.M. Cohen
  • Published online by Cambridge University Press:
    09 October 2013, pp. 298-299
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • The Central Analytical Facility at the University of Alabama

  • R.L. Martens, J.D. Goodwin, R.A. Holler, D.E. Nilkes, G.B. Thompson
  • Published online by Cambridge University Press:
    09 October 2013, pp. 300-301
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Instrumentation Sciences

A01.01 Gertrude Rempfer Memorial Symposium on Advances in Electron Optics and Aberration-Corrected Electron Microscopy

Abstract

  • High-Resolution LEEM/PEEM by Employing Mirror-Type Aberration Correctors - in Memory of Gertrude F. Rempfer

  • H.H. Rose
  • Published online by Cambridge University Press:
    09 October 2013, pp. 302-303
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • High-Resolution TEM/STEM by means of advanced Instrumentation

  • M. Haider, H. Mueller, P. Hartel
  • Published online by Cambridge University Press:
    09 October 2013, pp. 304-305
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Visualization of Optical Wave Propagation in Femtosecond Photoemission Electron Microscopy

  • R. Koenenkamp, R.C. Word, J.P.S. Fitzgerald
  • Published online by Cambridge University Press:
    09 October 2013, pp. 306-307
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Determination of Aberration Center of STEM Ronchigram for Fully Automated Aberration Correctors

  • T. Sannomiya, H. Sawada, T. Nakamichi, F. Hosokawa, Y. Nakamura, Y. Tanishiro, K. Takayanagi
  • Published online by Cambridge University Press:
    09 October 2013, pp. 308-309
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A01.02 Gertrude Rempfer Memorial Symposium on Advances in Electron Optics and Aberration-Corrected Electron Microscopy

Abstract

  • Improving the Spatial Resolution of Low-keV STEM with a Monochromator

  • T.C. Lovejoy, N. Dellby, G.J. Corbin, P. Hrncirik, M.F. Murfitt, Z.S. Szilagyi, O.L. Krivanek
  • Published online by Cambridge University Press:
    09 October 2013, pp. 312-313
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • A Monochromatic, Aberration-Corrected, Dual-Beam Low Energy Electron Microscope for DNA Sequencing and Surface Analysis

  • M. Mankos, K. Shadman, H. Persson, A. N'Diaye, A. Schmid, R. Davis
  • Published online by Cambridge University Press:
    09 October 2013, pp. 314-315
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • A New View on Bacterially-Produced Uraninite Nanoparticles Ultrastructure Revealed with Aberration Corrected STEM

  • A. Dohnalkova, A. Genc, K. Kemner, W. Burgos
  • Published online by Cambridge University Press:
    09 October 2013, pp. 316-317
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A01.03 Gertrude Rempfer Memorial Symposium on Advances in Electron Optics and Aberration-Corrected Electron Microscopy

Abstract

  • The Benefit of Automated Electron Diffraction Tomography (ADT) for Nano Science

  • U. Kolb
  • Published online by Cambridge University Press:
    09 October 2013, pp. 318-319
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • The Ultra-stable Scanning Transmission Electron Holography Microscope

  • R.A. Herring, D. Hoyle, Y. Taniguchi, M. Haider
  • Published online by Cambridge University Press:
    09 October 2013, pp. 320-321
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Quantitative Reconstruction and Analysis of HRTEM Complex Exit Waves using Inline Holography

  • C. Ophus, J. Ciston, P. Ercius, C. Koch
  • Published online by Cambridge University Press:
    09 October 2013, pp. 322-323
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Solving the 180 Degree Orientation Ambiguity Related to Spot Diffraction Patterns in Transmission Electron Microscopy

  • E.F. Rauch, M. Veron
  • Published online by Cambridge University Press:
    09 October 2013, pp. 324-325
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A01.P1 Gertrude Rempfer Memorial Symposium on Advances in Electron Optics and Aberration-Corrected Electron Microscopy

Abstract

  • Photoemission Microscopy for Integrated Photonics

  • R.C. Word, J.P. Fitzgerald, R. Konenkamp
  • Published online by Cambridge University Press:
    09 October 2013, pp. 326-327
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Page 27 of 70