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Volume 19 - August 2013

Contents

Page 32 of 70

Instrumentation Sciences

A03.P1 New Opportunities for In-situ Techniques and Instruments

Abstract

  • Failure Modes of Fluid Cell Chambers Used for Liquid In Situ Transmission Electron Microscopy

  • E. White, W.A. Hubbard, B.C. Regan
  • Published online by Cambridge University Press:
    09 October 2013, pp. 488-489
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • A Novel Method of Investigating Wet Bentonite Clay Particles in TEM

  • Y. Kuwamura, W.-A. Chiou, H. Minoda, R. Dohrmann, S. Kaufhold
  • Published online by Cambridge University Press:
    09 October 2013, pp. 490-491
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • In situ study of anode reaction in intermediate temperature solid oxide fuel cells

  • A.H. Tavabi, S. Muto, T. Tanji, R.E. Dunin-Borkowski
  • Published online by Cambridge University Press:
    09 October 2013, pp. 494-495
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Witness the Explosive Cu-Si Alloying Process inside a TEM

  • M. Li, D. Xie, Z. Shan
  • Published online by Cambridge University Press:
    09 October 2013, pp. 496-497
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Internal Temperature Calibration at Nanoscale on in situ Heating High Resolution Transmission Electron Microscopy

  • Y. Lan, H. Wang, G. Chen, Z. Ren
  • Published online by Cambridge University Press:
    09 October 2013, pp. 498-499
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A03.P2 New Opportunities for In-situ Techniques and Instruments

Abstract

  • Electron Annealing in Aluminum Interconnects Observed Using In Situ TEM Technique

  • D. Xie, M. Li, Z. Shan
  • Published online by Cambridge University Press:
    09 October 2013, pp. 502-503
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Local Current-activated Growth of Nanometric Nickel Pillars During In situ STM-TEM Experiments

  • K. van Benthem, J.F. Rufner, C.S. Bonifacio, T.B. Holland, R.H. Castro
  • Published online by Cambridge University Press:
    09 October 2013, pp. 504-505
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • EELS Analyses of Gaseous Atmosphere and Heated Specimen in an ETEM

  • T. Yaguchi, H. Kobayashi, A. Watabe, T. Kamino
  • Published online by Cambridge University Press:
    09 October 2013, pp. 506-507
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • In situ Studies of Catalytic Growth of SiC Nanowire

  • Y. Kang, P. Lu, X. Zhang, Z. Liu, J.L. Sturgeon, J. Mastovich, Z. Shan, J.C. Yang
  • Published online by Cambridge University Press:
    09 October 2013, pp. 508-509
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Development of SiN-coated Carbon Membranes for Environmental-cell Window

  • T. Kawsaki, Z. Cui, N. Imaeda, T. Tanji
  • Published online by Cambridge University Press:
    09 October 2013, pp. 510-511
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Oxidation of nickel particles in an environmental TEM

  • Q. Jeangros, T. Hansen, J. Wagner, R. Dunin-Borkowski, C. Hebert, J. Van herle, A. Hessler-Wyser
  • Published online by Cambridge University Press:
    09 October 2013, pp. 512-513
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • In Situ TEM Investigation on the Effect of Atmosphere on Anatase-To-Rutile Phase Transformation

  • H. Ghassemi, W. Harlow, R. Koc, M. Taheri
  • Published online by Cambridge University Press:
    09 October 2013, pp. 514-515
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • 3D Microstructural Analysis Using an In Situ Ultramicrotome (Gatan 3 View)

  • X. Zhong, T. Hashimoto, M.G. Burke, G.E. Thompson
  • Published online by Cambridge University Press:
    09 October 2013, pp. 516-517
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Electrical Properties of Pristine and Electron Irradiated CNT Yarns at Small Length Scales: An Electron Microscopy Study

  • F. Sola
  • Published online by Cambridge University Press:
    09 October 2013, pp. 518-519
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • The Contribution of Back Stress to Strength in Nanomaterials

  • A.J. Wagner, E.D. Hintsala, U.R. Kortshagen, W.W. Gerberich, K.A. Mkhoyan
  • Published online by Cambridge University Press:
    09 October 2013, pp. 522-523
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • In-Situ TEM Compression of MgO Nanocubes

  • E.D. Hintsala, A.J. Wagner, P.K. Suri, K.A. Mkhoyan, W.W. Gerberich
  • Published online by Cambridge University Press:
    09 October 2013, pp. 524-525
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Page 32 of 70