Hostname: page-component-78c5997874-8bhkd Total loading time: 0 Render date: 2024-11-05T21:45:20.695Z Has data issue: false hasContentIssue false
  • English
  • Français

Correlative Microscopy Using SIMS For High-Sensitivity Elemental Mapping

Published online by Cambridge University Press:  09 October 2013

T. Wirtz ,
D. Dowsett ,
N. Vanhove  and
Y. Fleming
T. Wirtz
Affiliation:
D. Dowsett
Affiliation:
N. Vanhove
Affiliation:
Y. Fleming
Affiliation:

Abstract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 356 - 357
Copyright
Copyright © Microscopy Society of America 2013