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TEM Characterization of 3D InAs QDs Grown under Subcritical Deposition

Published online by Cambridge University Press:  09 October 2013

S. Rouvimov ,
N. Ledentsov  and
V. Shchukin
S. Rouvimov
Affiliation:
N. Ledentsov
Affiliation:
V. Shchukin
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 332 - 333
Copyright
Copyright © Microscopy Society of America 2013