Solving the 180 Degree Orientation Ambiguity Related to Spot Diffraction Patterns in Transmission Electron Microscopy

E.F. Rauch; M. Veron

doi:10.1017/S1431927613003619

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Crossref Citations

This article has been cited by the following publications. This list is generated based on data provided by Crossref.

Rauch, E.F. and Véron, M. 2014. Automated crystal orientation and phase mapping in TEM. Materials Characterization, Vol. 98, Issue. , p. 1.

Aebersold, A. Brian Alexander, Duncan T.L. and Hébert, Cécile 2015. Height-resolved quantification of microstructure and texture in polycrystalline thin films using TEM orientation mapping. Ultramicroscopy, Vol. 159, Issue. , p. 112.

Yao, Xiayang Amin-Ahmadi, Behnam Li, Yuanyuan Cao, Shanshan Ma, Xiao Zhang, Xin-Ping and Schryvers, Dominique 2016. Optimization of Automated Crystal Orientation Mapping in a TEM for Ni4Ti3 Precipitation in All-Round SMA. Shape Memory and Superelasticity, Vol. 2, Issue. 4, p. 286.

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Aebersold, A. Brian Fanni, Lorenzo Hessler-Wyser, Aïcha Nicolay, Sylvain Ballif, Christophe Hébert, Cécile and Alexander, Duncan T.L. 2019. Quantifying competitive grain overgrowth in polycrystalline ZnO thin films. Acta Materialia, Vol. 173, Issue. , p. 74.

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Jeong, Jiwon Jang, Woo-Sung Kim, Kwang Hun Kostka, Aleksander Gu, Gilho Kim, Young-Min and Oh, Sang Ho 2021. Crystallographic Orientation Analysis of Nanocrystalline Tungsten Thin Film Using TEM Precession Electron Diffraction and SEM Transmission Kikuchi Diffraction. Microscopy and Microanalysis, Vol. 27, Issue. 2, p. 237.

Morales-Rivas, Lucia and Sundaram, Ganesh 2021. Parent austenite reconstruction tolerant to 180° ambiguity: Application to a very-high-cycle fatigue tested bearing-steel. Materials Characterization, Vol. 178, Issue. , p. 111253.

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Solving the 180 Degree Orientation Ambiguity Related to Spot Diffraction Patterns in Transmission Electron Microscopy

Abstract

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