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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Measuring Orbital Angular Momentum (OAM) and Torque Transfer from Polarization Vortices with the Electron Microscopy Pixel Array Detector

Age-related Cytological Changes of Fibroblast Cell and Fila Olfactoria in Fish: [Pseudapocryptes lanceolatus (Bloch and Schneider)]

Substitutionally Enhanced STEM (SE-STEM) Imaging of Protein Aggregates Inside Cells

Concepts for an Annular Pole Piece Detector for the Simultaneous Measurement of X-Rays and Backscattered Electrons Inside a SEM

Nanoscale Chiral Recognition Using Field Ion and Field Emission Microscopy

Scanning Electron Microscopy Characterization of Carbon Steel Fractured by Pressure while Exposed to Cryogenic Temperatures

Synthetic and natural Reference materials for EPMA, LA-ICPMS, LA-MC-ICPMS, SIMS, and Spectroscopic Microanalysis

Metal spatial distribution assessment in Phragmites sp.treating pyrite mining acid drainage: X-ray Micro-CT, SEM-EDS and ICP-AES study

X-ray Mapping in the Spectrum Image Mode at Output Count Rates above 100 kHz with the Silicon Drift Detector (SDD)

A Multiresolution Autofocusing Method for Automated Microscopy

First Direct Observation of Biological Molecules in Liquid by Environmental Phase Contrast Transmission Electron Microscopy

Electron Channelling Contrast Imaging (ECCI): An Amazing Tool for Observations of Crystal Lattice Defects in Bulk Samples

In-situ-by-Ex-situ:FIB-less Preparation of Bulk Samples on Heating Membranes for Atomic Resolution STEM Imaging

Automatic High-Spatial-Resolution Nuclear-Magnetic-Resonance Spectroscopy and Imaging System for Rock Cores

Grain Growth, Porosity, and Hardness Changes in Sintered and Annealed Binder-jet 3D Printed Ni-Mn-Ga Magnetic Shape Memory Alloys

Towards High Resolution in TEM and STEM: What are the Limitations and Achievements

Adding new dimension to electron tomography: measuring atomic structures and properties in 3D.

The Design and Implementation of a Single, Double, and Triple Concurrent Beam In Situ Ion Irradiation TEM Facility

TEM Characterization on Oxygen-Deficient Titania Supported Pt Electrocatalysts for Energy Conversion

Dark-Field Imaging based on Post-Processing of Electron Backscatter Diffraction Patterns in a Scanning Electron Microscope

Microscopy and Microanalysis

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