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A Complete Characterization of Samples Using Multivariate Statistical Analysis of 3Dimensional MCs+ ToF-SIMS Data

Published online by Cambridge University Press:  08 April 2017

V Smentkowski  and
M Keenan
V Smentkowski
Affiliation:
General Electric Global Research and Development
M Keenan
Affiliation:
Consultant

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1462 - 1463
Copyright
Copyright © Microscopy Society of America 2011