Hostname: page-component-78c5997874-dh8gc Total loading time: 0 Render date: 2024-11-17T01:15:56.288Z Has data issue: false hasContentIssue false
  • English
  • Français

A Complete Characterization of Samples Using Multivariate Statistical Analysis of 3Dimensional MCs+ ToF-SIMS Data

Published online by Cambridge University Press:  08 April 2017

V Smentkowski  and
M Keenan
V Smentkowski
Affiliation:
General Electric Global Research and Development
M Keenan
Affiliation:
Consultant

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1462 - 1463
Copyright
Copyright © Microscopy Society of America 2011